Apodization-Assisted Subdiffraction Near-Field Localization in 2D Phase Diffraction Grating; Annalen der Physik; Vol. 531, iss. 7

Bibliografski detalji
Parent link:Annalen der Physik
Vol. 531, iss. 7.— 2019.— [1900033, 5 p.]
Glavni autor: Geynts Yu. E. Yury Elmarovich
Autor kompanije: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение электронной инженерии
Daljnji autori: Minin O. V. Oleg Vladilenovich, Minin I. V. Igor Vladilenovich
Sažetak:Title screen
Conventional phase diffraction gratings can be used to localize the incoming optical radiation in the near‐field region. A new design of the binary phase diffraction grating is proposed with embedded pupil opaque mask inside each stripe. By means of numerical simulations, it is shown that with this masked phase grating the spatial resolution of the near-field localization can be substantially improved and brought even beyond the solid immersion limit ([lambda]/2n). Moreover, due to anomalous apodization effect, the subdiffraction field localization is accompanied by intensity enhancement as compared to the non-masked design. The pupil mask rearranges the optical fluxes within the stripes and promotes the Fano resonances excitation in the periodic step lattice. This can be important for advancing the phase grating-based super-resolution technologies, including subdiffraction imaging, interferometry, and surface fabrication.
Режим доступа: по договору с организацией-держателем ресурса
Jezik:engleski
Izdano: 2019
Teme:
Online pristup:https://doi.org/10.1002/andp.201900033
Format: Elektronički Poglavlje knjige
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664319

MARC

LEADER 00000naa0a2200000 4500
001 664319
005 20250418144421.0
035 |a (RuTPU)RU\TPU\network\35503 
035 |a RU\TPU\network\34899 
090 |a 664319 
100 |a 20210408d2019 k||y0rusy50 ba 
101 0 |a eng 
102 |a US 
135 |a drcn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Apodization-Assisted Subdiffraction Near-Field Localization in 2D Phase Diffraction Grating  |f Yu. E. Geynts, O. V. Minin, I. V. Minin 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 25 tit.] 
330 |a Conventional phase diffraction gratings can be used to localize the incoming optical radiation in the near‐field region. A new design of the binary phase diffraction grating is proposed with embedded pupil opaque mask inside each stripe. By means of numerical simulations, it is shown that with this masked phase grating the spatial resolution of the near-field localization can be substantially improved and brought even beyond the solid immersion limit ([lambda]/2n). Moreover, due to anomalous apodization effect, the subdiffraction field localization is accompanied by intensity enhancement as compared to the non-masked design. The pupil mask rearranges the optical fluxes within the stripes and promotes the Fano resonances excitation in the periodic step lattice. This can be important for advancing the phase grating-based super-resolution technologies, including subdiffraction imaging, interferometry, and surface fabrication. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Annalen der Physik 
463 |t Vol. 531, iss. 7  |v [1900033, 5 p.]  |d 2019 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a anomalous apodization 
610 1 |a binary diffraction grating 
610 1 |a Fano resonance 
610 1 |a focusing superresolution 
610 1 |a pupil mask 
610 1 |a аподизация 
610 1 |a дифракционные решетки 
610 1 |a сверхразрешение 
700 1 |a Geynts  |b Yu. E.  |g Yury Elmarovich 
701 1 |a Minin  |b O. V.  |c physicist  |c professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1960-  |g Oleg Vladilenovich  |3 (RuTPU)RU\TPU\pers\44941  |9 21866 
701 1 |a Minin  |b I. V.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1960-  |g Igor Vladilenovich  |3 (RuTPU)RU\TPU\pers\37571  |9 20427 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа неразрушающего контроля и безопасности  |b Отделение электронной инженерии  |3 (RuTPU)RU\TPU\col\23507 
801 2 |a RU  |b 63413507  |c 20210408  |g RCR 
850 |a 63413507 
856 4 |u https://doi.org/10.1002/andp.201900033 
942 |c CF