Structure and Phase Evolution in a SiC Ceramic Surface Layer During Electron-Beam Treatment

Structure and Phase Evolution in a SiC Ceramic Surface Layer During Electron-Beam Treatment

Бібліографічні деталі
Parent link:Refractories and Industrial Ceramics
Vol. 59, iss. 3.— 2018.— [P. 296-300]
Співавтор: Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Отделение материаловедения
Інші автори: Ivanov Yu. F. Yuriy Fedorovich, Khasanov O. L. Oleg Leonidovich, Petyukevich M. S. Mariya Stanislavovna, Polisadova V. V. Valentina Valentinovna, Bikbaeva Z. G. Zulfa Gadilzanovna, Teresov A. D. Anton Dmitrievich, Kalashnikov M. P. Mark Petrovich, Tolkachev O. S. Oleg Sergeevich, Kuzichkin E. E. Evgeny Evgenjevich
Резюме:Title screen
The elemental and phase compositions and substructure changes in the surface layer of SiC ceramic irradiated by pulsed electron beams of variable intensity were investigated. The structure and phase state of the ceramic surface layer were shown to be controlled by the electron-beam parameters. The electron-beam irradiation regimes leading to nanostructure detection in the SiC-ceramic surface layer were determined.
Режим доступа: по договору с организацией-держателем ресурса
Опубліковано: 2018
Предмети:
электронный ресурс
труды учёных ТПУ
SiC ceramic
electron beam
surface layer
polytypes
электронные лучи
поверхностные слои
Онлайн доступ:https://doi.org/10.1007/s11148-018-0224-2
Формат: Електронний ресурс Частина з книги
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664227
Опис
Резюме:Title screen
The elemental and phase compositions and substructure changes in the surface layer of SiC ceramic irradiated by pulsed electron beams of variable intensity were investigated. The structure and phase state of the ceramic surface layer were shown to be controlled by the electron-beam parameters. The electron-beam irradiation regimes leading to nanostructure detection in the SiC-ceramic surface layer were determined.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.1007/s11148-018-0224-2

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