Advanced Characterization Methods for Electrical and Sensoric Components and Devices at the Micro and Nano Scales; Physica Status Solidi A; Vol. 216, iss. 19

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Parent link:	Physica Status Solidi A: Journal Vol. 216, iss. 19.— 2019.— [1900106, 21 p.]
Nhiều tác giả của công ty:	Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Исследовательская школа химических и биомедицинских технологий
Tác giả khác:	Sheremet E. S. Evgeniya Sergeevna, Meszmer P. Peter, Blaudeck T. Thomas, Hartmann S. Susanne, Wagner Ch. Christian, Ma Bing, Hermann S. Sascha, Wunderle B. Bernhard, Schulz S. E. Stefan, Hietschold M. Michael, Rodriguez (Rodriges) Contreras R. D. Raul David, Zahn Dietrich R. T.
Tóm tắt:	Title screen The present study covers the nanoanalysis methods for four key material characteristics: electrical and electronic properties, optical, stress and strain, and chemical composition. With the downsizing of the geometrical dimensions of the electronic, optoelectronic, and electromechanical devices from the micro to the nanoscale and the simultaneous increase in the functionality density, the previous generation of microanalysis methods is no longer sufficient. Therefore, the metrology of materials' properties with nanoscale resolution is a prerequisite in materials' research and development. The article reviews the standard analysis methods and focuses on the advanced methods with a nanoscale spatial resolution based on atomic force microscopy (AFM): current‐sensing AFM (CS‐AFM), Kelvin probe force microscopy (KPFM), and hybrid optical techniques coupled with AFM including tip‐enhanced Raman spectroscopy (TERS), photothermal‐induced resonance (PTIR) characterization methods (nano‐Vis, nano‐IR), and photo‐induced force microscopy (PIFM). The simultaneous acquisition of multiple parameters (topography, charge and conductivity, stress and strain, and chemical composition) at the nanoscale is a key for exploring new research on structure-property relationships of nanostructured materials, such as carbon nanotubes (CNTs) and nano/microelectromechanical systems (N/MEMS). Advanced nanocharacterization techniques foster the design and development of new functional materials for flexible hybrid and smart applications.
Ngôn ngữ:	Tiếng Anh
Được phát hành:	2019
Những chủ đề:	электронный ресурс труды учёных ТПУ atomic force microscopy Kelvin probe force microscopy nanoanalysis Raman spectroscopy scanning probe microscopy атомно-силовая микроскопия спектроскопия наноструктурированные материалы
Truy cập trực tuyến:	https://doi.org/10.1002/pssa.201900106
Định dạng:	Điện tử Chương của sách
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=664184