Λεπτομέρειες βιβλιογραφικής εγγραφής
| Parent link: | Coatings
Vol. 10, iss. 2.— 2020.— [146, 10 p. ] |
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| Συγγραφή απο Οργανισμό/Αρχή: |
Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Научно-производственная лаборатория "Импульсно-пучковых, электроразрядных и плазменных технологий" |
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| Άλλοι συγγραφείς: |
Liang Guoying,
Zhong Haowen,
Wang Younian,
Zhang Shijian,
Xu Mofei,
Kuang Shicheng,
Ren Jianhui,
Zhang Nan,
Yan Sha,
Yu Xiao,
Remnev G. E. Gennady Efimovich,
Le Xiaoyun |
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| Περίληψη: | The process of ion implantation often involves vacancy generation and migration. The vacancy generation and migration near a monocrystalline silicon surface during three kinds of energetic Si35 cluster ion implantations were investigated by molecular dynamics simulations in the present work. The patterns of vacancy generation and migration, as well as the implantation-induced amorphous structure, were analyzed according to radial distribution function, Wigner–Seitz cell, and identify diamond structure analytical methods. A lot of vacancies rapidly generate and migrate in primary directions and form an amorphous structure in the first two picoseconds. The cluster with higher incident kinetic energy can induce the generation and migration of more vacancies and a deeper amorphous structure. Moreover, boundaries have a loading–unloading effect, where interstitial atoms load into the boundary, which then acts as a source, emitting interstitial atoms to the target and inducing the generation of vacancies again. These results provide more insight into doping silicon via ion implantation. |
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| Γλώσσα: | Αγγλικά |
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| Έκδοση: |
2020
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| Θέματα: | |
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| Διαθέσιμο Online: | https://doi.org/10.3390/coatings10020146
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| Μορφή: | Ηλεκτρονική πηγή
Κεφάλαιο βιβλίου
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| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663978 |
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