Comparing the efficiency of defect depth characterization algorithms in the inspection of CFRP by using one-sided pulsed thermal NDT; Infrared Physics and Technology; Vol. 107

Dades bibliogràfiques
Parent link:Infrared Physics and Technology
Vol. 107.— 2020.— [103289, 12 p.]
Autor principal: Moskovchenko A. I. Aleksey Igorevich
Autor corporatiu: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Центр промышленной томографии Научно-производственная лаборатория "Тепловой контроль", Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Центр промышленной томографии Научно-производственная лаборатория "Бетатронная томография крупногабаритных объектов"
Altres autors: Vavilov V. P. Vladimir Platonovich, Chulkov A. O. Arseniy Olegovich
Sumari:Title screen
The efficiency of eight algorithms of defect depth characterization (pulse phase thermography – PPT, thermographic signal reconstruction by analyzing the first and second derivatives– TSR, early observation – EO, apparent thermal inertia – ATI, thermal quadrupoles - TQ, non-linear fitting - NLF and neural networks – NN) has been comparatively analyzed on both theoretical and experimental IR image sequences obtained in the inspection of CFRP composite. Synthetic noise-free image sequences have been calculated by means of the ThermoCalc-3D software, while experimental results have been obtained by applying a one-sided procedure of pulsed thermal NDT to the inspection of artificial defects in CFRP. A relative error in the evaluation of defect depth has been chosen as a figure of merit. It has been demonstrated that a simple and robust processing technique is the use of the Fourier transform resulting in phase-domain data (PPT). The technique of TSR ensures maximal values of signal-to-noise ratio and is less susceptible to uneven heating and lateral heat diffusion. The calculation of ATI has allowed the characterization of defects at depths up to 1.5 mm, but it is sensitive to uneven heating thus requiring to carefully choose a non-defect area. The EO method, as well as the technique of TQ, have revealed inferior results in defect depth identification because of a noisy character of raw signals. Non-linear fitting is a convenient processing technique allowing simultaneous characterization of some test parameters, such as material thermal properties, defect depth and thickness, etc., but this technique is time-consuming and can hardly be applied to full-format images. In the whole defect depth range, minimal characterization errors have been ensured by the use of the NN that is a promising tool for automated identification of hidden defects.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:anglès
Publicat: 2020
Matèries:
Accés en línia:https://doi.org/10.1016/j.infrared.2020.103289
Format: Electrònic Capítol de llibre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663943

MARC

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200 1 |a Comparing the efficiency of defect depth characterization algorithms in the inspection of CFRP by using one-sided pulsed thermal NDT  |f A. I. Moskovchenko, V. P. Vavilov, A. O. Chulkov 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 41 tit.] 
330 |a The efficiency of eight algorithms of defect depth characterization (pulse phase thermography – PPT, thermographic signal reconstruction by analyzing the first and second derivatives– TSR, early observation – EO, apparent thermal inertia – ATI, thermal quadrupoles - TQ, non-linear fitting - NLF and neural networks – NN) has been comparatively analyzed on both theoretical and experimental IR image sequences obtained in the inspection of CFRP composite. Synthetic noise-free image sequences have been calculated by means of the ThermoCalc-3D software, while experimental results have been obtained by applying a one-sided procedure of pulsed thermal NDT to the inspection of artificial defects in CFRP. A relative error in the evaluation of defect depth has been chosen as a figure of merit. It has been demonstrated that a simple and robust processing technique is the use of the Fourier transform resulting in phase-domain data (PPT). The technique of TSR ensures maximal values of signal-to-noise ratio and is less susceptible to uneven heating and lateral heat diffusion. The calculation of ATI has allowed the characterization of defects at depths up to 1.5 mm, but it is sensitive to uneven heating thus requiring to carefully choose a non-defect area. The EO method, as well as the technique of TQ, have revealed inferior results in defect depth identification because of a noisy character of raw signals. Non-linear fitting is a convenient processing technique allowing simultaneous characterization of some test parameters, such as material thermal properties, defect depth and thickness, etc., but this technique is time-consuming and can hardly be applied to full-format images. In the whole defect depth range, minimal characterization errors have been ensured by the use of the NN that is a promising tool for automated identification of hidden defects. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Infrared Physics and Technology 
463 |t Vol. 107  |v [103289, 12 p.]  |d 2020 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a compositions 
610 1 |a thermal quadrupoles 
610 1 |a defect depth characterization 
610 1 |a neural network 
610 1 |a нейронная сеть 
610 1 |a неразрушающий контроль 
610 1 |a тепловые квадруполи 
610 1 |a композиты 
610 1 |a глубина дефекта 
700 1 |a Moskovchenko  |b A. I.  |g Aleksey Igorevich 
701 1 |a Vavilov  |b V. P.  |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT)  |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)  |f 1949-  |g Vladimir Platonovich  |3 (RuTPU)RU\TPU\pers\32161  |9 16163 
701 1 |a Chulkov  |b A. O.  |c specialist in the field of non-destructive testing  |c Deputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences  |f 1989-  |g Arseniy Olegovich  |3 (RuTPU)RU\TPU\pers\32220  |9 16220 
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