Moskovchenko A. I. Aleksey Igorevich, Vavilov V. P. Vladimir Platonovich, & Chulkov A. O. Arseniy Olegovich. (2020). Comparing the efficiency of defect depth characterization algorithms in the inspection of CFRP by using one-sided pulsed thermal NDT; Infrared Physics and Technology; Vol. 107. 2020. https://doi.org/10.1016/j.infrared.2020.103289
Citazione stile Chigago Style (17a edizione)Moskovchenko A. I. Aleksey Igorevich, Vavilov V. P. Vladimir Platonovich, e Chulkov A. O. Arseniy Olegovich. Comparing the Efficiency of Defect Depth Characterization Algorithms in the Inspection of CFRP by Using One-sided Pulsed Thermal NDT; Infrared Physics and Technology; Vol. 107. 2020, 2020. https://doi.org/10.1016/j.infrared.2020.103289.
Citatione MLA (9a ed.)Moskovchenko A. I. Aleksey Igorevich, et al. Comparing the Efficiency of Defect Depth Characterization Algorithms in the Inspection of CFRP by Using One-sided Pulsed Thermal NDT; Infrared Physics and Technology; Vol. 107. 2020, 2020. https://doi.org/10.1016/j.infrared.2020.103289.