Focusing of intense pulsed ion beam by magnetically insulated diode for material research; Surface and Coatings Technology; Vol. 384

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Parent link:Surface and Coatings Technology
Vol. 384.— 2020.— [125351, 7 p.]
Korporace: Национальный исследовательский Томский политехнический университет Инженерная школа новых производственных технологий Научно-производственная лаборатория "Импульсно-пучковых, электроразрядных и плазменных технологий", Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов
Další autoři: Yu Xiao, Zhang Shijian, Stepanov A. V. Andrey Vladimirovich, Shamanin V. I. Vitaly Igorevich, Zhong Haowen, Liang Guoying, Xu Mofei, Zhang Nan, Kuang Shicheng, Ren Jianhui, Shang Xuying, Yan Sha, Remnev G. E. Gennady Efimovich, Le Xiaoyun
Shrnutí:Title screen
The cross-sectional distribution and focusing properties of intense pulsed ion beam by an active magnetically insulated diode for material modification is presented. The ion beam accelerator BIPPAB-450 uses the surface flashover of polymers as the ion source, generates intense pulsed ion beam composed of protons and carbon ions with a pulse length of 120 ns, ion energy up to 450 keV, energy density up to 3 J/cm2. By the strong flash thermal effects on the surface of materials, the ion beam can be used for the surface treatment and ablation related application. The cross-sectional distribution of the ion beam was measured by infrared imaging method. The results on the focusing of the diode reveal the distribution in the plasma generation on the anode surface. Comparative study on beam focusing during transportation was made and it is demonstrated that by using a copper beam limiter, the maximum beam energy density can be increased by a factor of nearly 1.5. The change in the beam phase-space distribution by the limiter is also exhibited and the influence on beam diagnostics and optimization is discussed reasonably.
Режим доступа: по договору с организацией-держателем ресурса
Jazyk:angličtina
Vydáno: 2020
Témata:
On-line přístup:https://doi.org/10.1016/j.surfcoat.2020.125351
Médium: Elektronický zdroj Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663911

MARC

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200 1 |a Focusing of intense pulsed ion beam by magnetically insulated diode for material research  |f Yu Xiao, Zhang Shijian, A. V. Stepanov [et al.] 
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320 |a [References: 42 tit.] 
330 |a The cross-sectional distribution and focusing properties of intense pulsed ion beam by an active magnetically insulated diode for material modification is presented. The ion beam accelerator BIPPAB-450 uses the surface flashover of polymers as the ion source, generates intense pulsed ion beam composed of protons and carbon ions with a pulse length of 120 ns, ion energy up to 450 keV, energy density up to 3 J/cm2. By the strong flash thermal effects on the surface of materials, the ion beam can be used for the surface treatment and ablation related application. The cross-sectional distribution of the ion beam was measured by infrared imaging method. The results on the focusing of the diode reveal the distribution in the plasma generation on the anode surface. Comparative study on beam focusing during transportation was made and it is demonstrated that by using a copper beam limiter, the maximum beam energy density can be increased by a factor of nearly 1.5. The change in the beam phase-space distribution by the limiter is also exhibited and the influence on beam diagnostics and optimization is discussed reasonably. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Surface and Coatings Technology 
463 |t Vol. 384  |v [125351, 7 p.]  |d 2020 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a intense pulsed ion beam 
610 1 |a magnetically insulated diode 
610 1 |a material modification 
610 1 |a beam focusing 
610 1 |a infrared imaging diagnostics 
701 0 |a Yu Xiao 
701 0 |a Zhang Shijian 
701 1 |a Stepanov  |b A. V.  |c physicist  |c Researcher of Tomsk Polytechnic University  |f 1981-  |g Andrey Vladimirovich  |3 (RuTPU)RU\TPU\pers\32029  |9 16076 
701 1 |a Shamanin  |b V. I.  |c physicist  |c engineer at Tomsk Polytechnic University  |f 1989-  |g Vitaly Igorevich  |3 (RuTPU)RU\TPU\pers\37443 
701 0 |a Zhong Haowen 
701 0 |a Liang Guoying 
701 0 |a Xu Mofei 
701 0 |a Zhang Nan 
701 0 |a Kuang Shicheng 
701 0 |a Ren Jianhui 
701 0 |a Shang Xuying 
701 0 |a Yan Sha 
701 1 |a Remnev  |b G. E.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1948-  |g Gennady Efimovich  |3 (RuTPU)RU\TPU\pers\31500 
701 0 |a Le Xiaoyun 
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