Super-Enhancement Focusing of Teflon Spheres; Annalen der Physik; Vol. 532, iss. 10
| Parent link: | Annalen der Physik Vol. 532, iss. 10.— 2020.— [2000373, 9 p.] |
|---|---|
| Autor Corporativo: | |
| Outros Autores: | , , , , , , , |
| Resumo: | Title screen A Teflon (polytetrafluoroethylene) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low?loss property in the terahertz band. Herein, field intensities and focusing parameters are analytically calculated for Teflon spheres at different low?loss levels and then a super?enhancement focusing effect in the spheres with particular size parameters was discovered, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proves that the strong scattering of a single?order mode in the internal electric or magnetic field is the main factor causing this phenomenon. Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | inglês |
| Publicado em: |
2020
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| Assuntos: | |
| Acesso em linha: | https://doi.org/10.1002/andp.202000373 |
| Formato: | Recurso Electrónico Capítulo de Livro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663729 |
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| 200 | 1 | |a Super-Enhancement Focusing of Teflon Spheres |f Yue Liyang, Wang Zengbo, Bing Yan [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 38 tit.] | ||
| 330 | |a A Teflon (polytetrafluoroethylene) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low?loss property in the terahertz band. Herein, field intensities and focusing parameters are analytically calculated for Teflon spheres at different low?loss levels and then a super?enhancement focusing effect in the spheres with particular size parameters was discovered, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proves that the strong scattering of a single?order mode in the internal electric or magnetic field is the main factor causing this phenomenon. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Annalen der Physik | ||
| 463 | |t Vol. 532, iss. 10 |v [2000373, 9 p.] |d 2020 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a dielectric particles | |
| 610 | 1 | |a low-loss materials | |
| 610 | 1 | |a Mie theory | |
| 610 | 1 | |a near-field focusing | |
| 610 | 1 | |a Teflon spheres | |
| 610 | 1 | |a диэлектрические частицы | |
| 701 | 0 | |a Yue Liyang | |
| 701 | 0 | |a Wang Zengbo | |
| 701 | 0 | |a Bing Yan | |
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| 701 | 1 | |a Joya |b Ya. F. |g Yasir | |
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