Super-Enhancement Focusing of Teflon Spheres; Annalen der Physik; Vol. 532, iss. 10
| Parent link: | Annalen der Physik Vol. 532, iss. 10.— 2020.— [2000373, 9 p.] |
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| Institution som forfatter: | |
| Andre forfattere: | , , , , , , , |
| Summary: | Title screen A Teflon (polytetrafluoroethylene) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low?loss property in the terahertz band. Herein, field intensities and focusing parameters are analytically calculated for Teflon spheres at different low?loss levels and then a super?enhancement focusing effect in the spheres with particular size parameters was discovered, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proves that the strong scattering of a single?order mode in the internal electric or magnetic field is the main factor causing this phenomenon. Режим доступа: по договору с организацией-держателем ресурса |
| Sprog: | engelsk |
| Udgivet: |
2020
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| Fag: | |
| Online adgang: | https://doi.org/10.1002/andp.202000373 |
| Format: | Electronisk Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663729 |
| Summary: | Title screen A Teflon (polytetrafluoroethylene) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low?loss property in the terahertz band. Herein, field intensities and focusing parameters are analytically calculated for Teflon spheres at different low?loss levels and then a super?enhancement focusing effect in the spheres with particular size parameters was discovered, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proves that the strong scattering of a single?order mode in the internal electric or magnetic field is the main factor causing this phenomenon. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1002/andp.202000373 |