A New Models of Barrier Discherge Excilamps for Liquid Penetrant Inspection; Energy Fluxes and Radiation Effects (EFRE-2020 online)

Bibliographische Detailangaben
Parent link:Energy Fluxes and Radiation Effects (EFRE-2020 online).— 2020.— [P. 1034-1036]
Körperschaften: Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение контроля и диагностики, Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение электронной инженерии
Weitere Verfasser: Panarin V. Victor, Kalinichenko A. N. Aleksey Nikolaevich, Avdeev S. Sergei, Pechenitsin D. Pechenitsin, Tarasenko V. F. Victor Fedotovich, Sosnin E. Eduard, Skakun V. Victor
Zusammenfassung:Title screen
Dielectric barrier discharge XeCl-excilamps can be used for detecting of surface defects in case of the luminescent liquid penetrant inspection method (LLPI). In case of LLPI, surface defects are detected by brightly glowing indications formed on the developing coating (developing agent) in the locations of discontinuities. This method differs from the color one that the inspection is performed under darkening conditions and requires ultraviolet irradiation, so it is more sensitive, since the visual luminescence of the display is detected better than the color contrast. This article experimentally compares the results of LLPI using different UV-light sources (two barrier discharge excilamps (portable and front-mounted), a mercury UV lamp and an led UV lantern). It is shown that the XeCl-excilamp gives a good detection and fixation of indicator traces in comparison with other sources of UV radiation.
Режим доступа: по договору с организацией-держателем ресурса
Sprache:Englisch
Veröffentlicht: 2020
Schlagworte:
Online-Zugang:https://doi.org/10.1109/EFRE47760.2020.9241921
Format: Elektronisch Buchkapitel
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663083

MARC

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200 1 |a A New Models of Barrier Discherge Excilamps for Liquid Penetrant Inspection  |f V. Panarin, A. N. Kalinichenko, S. Avdeev [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: p. 1036 (8 tit.)] 
330 |a Dielectric barrier discharge XeCl-excilamps can be used for detecting of surface defects in case of the luminescent liquid penetrant inspection method (LLPI). In case of LLPI, surface defects are detected by brightly glowing indications formed on the developing coating (developing agent) in the locations of discontinuities. This method differs from the color one that the inspection is performed under darkening conditions and requires ultraviolet irradiation, so it is more sensitive, since the visual luminescence of the display is detected better than the color contrast. This article experimentally compares the results of LLPI using different UV-light sources (two barrier discharge excilamps (portable and front-mounted), a mercury UV lamp and an led UV lantern). It is shown that the XeCl-excilamp gives a good detection and fixation of indicator traces in comparison with other sources of UV radiation. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
463 0 |0 (RuTPU)RU\TPU\network\34152  |t Energy Fluxes and Radiation Effects (EFRE-2020 online)  |o proceedings of 7th International Congress, September 14-26, 2020, Tomsk, Russia  |f National Research Tomsk Polytechnic University (TPU) ; Institute of Electrical and Electronics Engineers (IEEE) ; ed. N. A. Ratakhin  |v [P. 1034-1036]  |d 2020 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a check sample 
610 1 |a excilamp 
610 1 |a led lantern 
610 1 |a liquid penetrant inspection 
610 1 |a luminescence 
610 1 |a mercury UV lamp 
610 1 |a ultraviolet radiation 
610 1 |a эксилампы 
610 1 |a фонари 
610 1 |a светодиоды 
610 1 |a люминесценция 
610 1 |a ртутные лампы 
610 1 |a УФ-излучения 
701 1 |a Panarin  |b V.  |g Victor 
701 1 |a Kalinichenko  |b A. N.  |c specialist in the field of descriptive geometry  |c Associate Professor of Tomsk Polytechnic University, Candidate of technical sciences  |f 1981-  |g Aleksey Nikolaevich  |3 (RuTPU)RU\TPU\pers\31018  |9 15248 
701 1 |a Avdeev  |b S.  |g Sergei 
701 1 |a Pechenitsin  |b D.  |g Pechenitsin 
701 1 |a Tarasenko  |b V. F.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1946-  |g Victor Fedotovich  |3 (RuTPU)RU\TPU\pers\32090 
701 1 |a Sosnin  |b E.  |g Eduard 
701 1 |a Skakun  |b V.  |g Victor 
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712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа неразрушающего контроля и безопасности  |b Отделение электронной инженерии  |3 (RuTPU)RU\TPU\col\23507 
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