Morphology of Destructions of Solid Bodies under Irradiation by a High-Current Electron Beam in Filamented and Self-Focused Mode; Energy Fluxes and Radiation Effects (EFRE-2020 online)
| Parent link: | Energy Fluxes and Radiation Effects (EFRE-2020 online).— 2020.— [P. 906-910] |
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| Enti autori: | , |
| Altri autori: | , , , |
| Riassunto: | Title screen The autographic method was used to study the morphology of the damage occurring on the surface of metals and in polymethylmethacrylate (PMMA) after a single exposure to an electron beam formed in the vacuum diode of a pulsed electron accelerator in the modes of filamentation and self-focusing. It was found that in the zones of interaction between the filamentous beam and PMMA at a depth of 40-80 [mu]m, micro-fractures of a round and more complex shape with a diameter of 10-50 [mu]m form. The mechanism of local microdestruction formation is analyzed. Режим доступа: по договору с организацией-держателем ресурса |
| Lingua: | inglese |
| Pubblicazione: |
2020
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| Soggetti: | |
| Accesso online: | https://doi.org/10.1109/EFRE47760.2020.9242003 |
| Natura: | MixedMaterials Elettronico Capitolo di libro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663079 |
MARC
| LEADER | 00000naa2a2200000 4500 | ||
|---|---|---|---|
| 001 | 663079 | ||
| 005 | 20251216155035.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\34248 | ||
| 035 | |a RU\TPU\network\34247 | ||
| 090 | |a 663079 | ||
| 100 | |a 20210122d2020 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Morphology of Destructions of Solid Bodies under Irradiation by a High-Current Electron Beam in Filamented and Self-Focused Mode |f V. I. Oleshko, A. N. Yakovlev, V. F. Tarasenko, Van Vu Nguyen | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 910 (12 tit.)] | ||
| 330 | |a The autographic method was used to study the morphology of the damage occurring on the surface of metals and in polymethylmethacrylate (PMMA) after a single exposure to an electron beam formed in the vacuum diode of a pulsed electron accelerator in the modes of filamentation and self-focusing. It was found that in the zones of interaction between the filamentous beam and PMMA at a depth of 40-80 [mu]m, micro-fractures of a round and more complex shape with a diameter of 10-50 [mu]m form. The mechanism of local microdestruction formation is analyzed. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 463 | 0 | |0 (RuTPU)RU\TPU\network\34152 |t Energy Fluxes and Radiation Effects (EFRE-2020 online) |o proceedings of 7th International Congress, September 14-26, 2020, Tomsk, Russia |f National Research Tomsk Polytechnic University (TPU) ; Institute of Electrical and Electronics Engineers (IEEE) ; ed. N. A. Ratakhin |v [P. 906-910] |d 2020 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a vacuum diode | |
| 610 | 1 | |a electron beam | |
| 610 | 1 | |a filamentation | |
| 610 | 1 | |a selffocusing | |
| 610 | 1 | |a solids | |
| 610 | 1 | |a destruction | |
| 610 | 1 | |a вакуумные диоды | |
| 610 | 1 | |a электронные пучки | |
| 610 | 1 | |a самофокусировка | |
| 610 | 1 | |a твердые тела | |
| 610 | 1 | |a разрушения | |
| 610 | 1 | |a облучение | |
| 701 | 1 | |a Oleshko |b V. I. |c specialist in the field of lightning engineering |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences |f 1948- |g Vladimir Ivanovich |3 (RuTPU)RU\TPU\pers\33783 |9 17381 | |
| 701 | 1 | |a Yakovlev |b A. N. |c specialist in the field of lightning engineering |c Vice-rector-Director of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1971- |g Aleksey Nikolaevich |3 (RuTPU)RU\TPU\pers\31580 | |
| 701 | 1 | |a Tarasenko |b V. F. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences |f 1946- |g Victor Fedotovich |3 (RuTPU)RU\TPU\pers\32090 | |
| 701 | 0 | |a Van Vu Nguyen | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа новых производственных технологий |b Отделение материаловедения |3 (RuTPU)RU\TPU\col\23508 |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа неразрушающего контроля и безопасности |b Отделение электронной инженерии |3 (RuTPU)RU\TPU\col\23507 |
| 801 | 2 | |a RU |b 63413507 |c 20210203 |g RCR | |
| 856 | 4 | |u https://doi.org/10.1109/EFRE47760.2020.9242003 | |
| 942 | |c CF | ||