The Structure and Mechanical Characteristics of the Hypereutectic Silumin (Al-22-24 wt.% Si), Irradiated by a Pulsed Electron Beam; Energy Fluxes and Radiation Effects (EFRE-2020 online)

Dettagli Bibliografici
Parent link:Energy Fluxes and Radiation Effects (EFRE-2020 online).— 2020.— [P. 460-463]
Altri autori: Petrikova E. Elizaveta, Ivanov Yu. F. Yuriy Fedorovich, Rygina M. Maria, Prudnicov A. Alexander, Teresov A. Anton, Vorobjev (Vorobyov) M. S. Maksim Sergeevich
Riassunto:Title screen
Irradiation ("SOLO" setup, High-Current Electronics Institute SB RAS) of hypereutectic Al- (22-24) Si composition silumin samples with an intense pulsed electron beam was carried out. The formation of a multiphase submicron nanocrystalline structure is revealed. It was found that after modification, the hardness of silumin surface layer increases by more than 2 times. Tensile tests were carried out for flat proportional silumin samples in the initial and after irradiation states. An increase in the ductility of irradiated samples was demonstrated.
AM_Agreement
Lingua:inglese
Pubblicazione: 2020
Soggetti:
Accesso online:https://doi.org/10.1109/EFRE47760.2020.9241979
Natura: Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=663043

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200 1 |a The Structure and Mechanical Characteristics of the Hypereutectic Silumin (Al-22-24 wt.% Si), Irradiated by a Pulsed Electron Beam  |f E. Petrikova, Yu. F. Ivanov, M. Rygina [et al.] 
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330 |a Irradiation ("SOLO" setup, High-Current Electronics Institute SB RAS) of hypereutectic Al- (22-24) Si composition silumin samples with an intense pulsed electron beam was carried out. The formation of a multiphase submicron nanocrystalline structure is revealed. It was found that after modification, the hardness of silumin surface layer increases by more than 2 times. Tensile tests were carried out for flat proportional silumin samples in the initial and after irradiation states. An increase in the ductility of irradiated samples was demonstrated. 
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463 1 |0 (RuTPU)RU\TPU\network\34152  |t Energy Fluxes and Radiation Effects (EFRE-2020 online)  |o proceedings of 7th International Congress, September 14-26, 2020, Tomsk, Russia  |f National Research Tomsk Polytechnic University (TPU) ; Institute of Electrical and Electronics Engineers (IEEE) ; ed. N. A. Ratakhin  |v [P. 460-463]  |d 2020 
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610 1 |a silicon 
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610 1 |a импульсные электронные пучки 
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701 1 |a Teresov  |b A.  |g Anton 
701 1 |a Vorobjev (Vorobyov)  |b M. S.  |c specialist in the field of electronics  |c Professor of Tomsk Polytechnic University, Doctor of Technical Sciences  |f 1986-  |g Maksim Sergeevich  |9 89110 
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