Study and production of thin-film memristors based on TiO2 – TiOx layers

Détails bibliographiques
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 498 : Advanced Micro- and Nanoelectronic Systems and Technologies.— 2019.— [012022, 4 p.]
Collectivité auteur: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Научно-образовательный центр Б. П. Вейнберга
Autres auteurs: Zhidik E. V. Ekaterina Vyacheslavovna, Troyan P. E. Pavel Efimovich, Sakharov Yu. V. Yury Vladimirovich, Zhidik Yu. S. Yury Sergeevich, Korzhenko D. V. Dmitry Vladimirovich
Résumé:Title screen
Results of production of thin-film memristor MIM-structures based on the stoichiometric (TiO2) and nonstoichiometric (TiOx) titanium oxides and contacts without precious and rare-earth metals are given. It is shown that such memristor structures without precious metals show its operability only after the process of electrical forming.
Publié: 2019
Sujets:
Accès en ligne:https://doi.org/10.1088/1757-899X/498/1/012022
Format: Électronique Chapitre de livre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=662537
Description
Résumé:Title screen
Results of production of thin-film memristor MIM-structures based on the stoichiometric (TiO2) and nonstoichiometric (TiOx) titanium oxides and contacts without precious and rare-earth metals are given. It is shown that such memristor structures without precious metals show its operability only after the process of electrical forming.
DOI:10.1088/1757-899X/498/1/012022