Localized surface curvature artifacts in tip-enhanced nanospectroscopy imaging; Ultramicroscopy; Vol. 206

গ্রন্থ-পঞ্জীর বিবরন
Parent link:	Ultramicroscopy Vol. 206.— 2019.— [112811, 8 p.]
সংস্থা লেখক:	Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Исследовательская школа химических и биомедицинских технологий (ИШХБМТ)
অন্যান্য লেখক:	Sheremet E. S. Evgeniya Sergeevna, Kim L. R. Larisa Robertovna, Stepanishcheva D. I. Darjya Igorevna, Kolchuzhin V. A. Vladimir Anatoljevich, Milekhin A. G. Aleksandr Germanovich, Zahn D. R. T. Dietrich, Rodriguez (Rodriges) Contreras R. D. Raul David
সংক্ষিপ্ত:	Title screen Tip-enhanced Raman spectroscopy (TERS) allows the chemical analysis with a spatial resolution at the nanoscale, well beyond what the diffraction limit of light makes possible. We can further boost the TERS sensitivity by using a metallic substrate in the so-called gap-mode TERS. In this context, the goal of this work is to provide a generalized view of imaging artifacts in TERS and near-field imaging that occur due to tip-sample coupling. Contrary to the case of gap-mode with a flat substrate where the size of the enhanced region is smaller than the tip size when visualizing 3D nanostructures the tip convolution effect may broaden the observed dimensions due to the local curvature of the sample. This effect is particularly critical considering that most works on gap-mode TERS consider a perfectly flat substrate which is rarely the case in actual experiments. We investigate a range of substrates to evidence these geometrical effects and to obtain an understanding of the nanoscale curvature role in TERS imaging. Our experimental results are complemented by numerical simulations and an analogy with atomic force microscopy artifacts is introduced. As a result, this work offers a useful analysis of gap-mode TERS imaging with tip- and substrate-related artifacts furthering our understanding and the reliability of near-field optical nanospectroscopy. Режим доступа: по договору с организацией-держателем ресурса
ভাষা:	ইংরেজি
প্রকাশিত:	2019
বিষয়গুলি:	электронный ресурс труды учёных ТПУ imaging artifacts plasmonics nanospectroscopy scanning probe microscopy плазмоника зондовые методы микроскопия
অনলাইন ব্যবহার করুন:	https://doi.org/10.1016/j.ultramic.2019.112811
বিন্যাস:	বৈদ্যুতিক গ্রন্থের অধ্যায়
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=662434