Spectral distribution in the reflection of parametric X-rays; Journal of Physics: Conference Series; Vol. 517, iss. 1 : RREPS-13. Radiation from Relativistic Electrons in Periodic Structures and Meghri-13. Electron, Positron, Neutron and X-ray Scattering under External Influences

Bibliografske podrobnosti
Parent link:Journal of Physics: Conference Series
Vol. 517, iss. 1 : RREPS-13. Radiation from Relativistic Electrons in Periodic Structures and Meghri-13. Electron, Positron, Neutron and X-ray Scattering under External Influences.— 2014.— [012018, 8 p.]
Korporativna značnica: Национальный исследовательский Томский политехнический университет Физико-технический институт Кафедра прикладной физики (№ 12)
Drugi avtorji: Chesnokov Y. A., Shchagin A. V., Kubankin A. S., Potylitsyn A. P. Alexander Petrovich, Gogolev A. S. Aleksey Sergeevich, Uglov S. R. Sergey Romanovich, Cherepennikov Yu. M. Yuriy Mihaylovich, Karataev P. V. Pavel Vladimirovich
Izvleček:Title screen
The parametric X-ray radiation (PXR) spectra are measured on condition when the angular size of PXR cone is smaller than the angular resolution of the experiment. The PXR is generated under interaction of 50GeV proton beam with silicon crystal in Bragg geometry. The comparison of experimental data with results of developed theoretical model is presented and discussed
Jezik:angleščina
Izdano: 2014
Teme:
Online dostop:https://doi.org/10.1088/1742-6596/517/1/012018
Format: Elektronski Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=661852
Opis
Izvleček:Title screen
The parametric X-ray radiation (PXR) spectra are measured on condition when the angular size of PXR cone is smaller than the angular resolution of the experiment. The PXR is generated under interaction of 50GeV proton beam with silicon crystal in Bragg geometry. The comparison of experimental data with results of developed theoretical model is presented and discussed
DOI:10.1088/1742-6596/517/1/012018