Spectral distribution in the reflection of parametric X-rays

Bibliografische gegevens
Parent link:Journal of Physics: Conference Series
Vol. 517, iss. 1 : RREPS-13. Radiation from Relativistic Electrons in Periodic Structures and Meghri-13. Electron, Positron, Neutron and X-ray Scattering under External Influences.— 2014.— [012018, 8 p.]
Coauteur: Национальный исследовательский Томский политехнический университет Физико-технический институт Кафедра прикладной физики (№ 12)
Andere auteurs: Chesnokov Y. A., Shchagin A. V., Kubankin A. S., Potylitsyn A. P. Alexander Petrovich, Gogolev A. S. Aleksey Sergeevich, Uglov S. R. Sergey Romanovich, Cherepennikov Yu. M. Yuriy Mihaylovich, Karataev P. V. Pavel Vladimirovich
Samenvatting:Title screen
The parametric X-ray radiation (PXR) spectra are measured on condition when the angular size of PXR cone is smaller than the angular resolution of the experiment. The PXR is generated under interaction of 50GeV proton beam with silicon crystal in Bragg geometry. The comparison of experimental data with results of developed theoretical model is presented and discussed
Gepubliceerd in: 2014
Onderwerpen:
Online toegang:https://doi.org/10.1088/1742-6596/517/1/012018
Formaat: Elektronisch Hoofdstuk
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=661852
Omschrijving
Samenvatting:Title screen
The parametric X-ray radiation (PXR) spectra are measured on condition when the angular size of PXR cone is smaller than the angular resolution of the experiment. The PXR is generated under interaction of 50GeV proton beam with silicon crystal in Bragg geometry. The comparison of experimental data with results of developed theoretical model is presented and discussed
DOI:10.1088/1742-6596/517/1/012018