Application of Phase-Reversal Fresnel Zone Plates for Improving The Elevation Resolution in Ultrasonic Testing with Phased Arrays; Sensors; Vol. 19, iss. 23

Dades bibliogràfiques
Parent link:Sensors
Vol. 19, iss. 23.— 2019.— [5080, 13 р.]
Autor corporatiu: Национальный исследовательский Томский политехнический университет Институт неразрушающего контроля Международная научно-образовательная лаборатория неразрушающего контроля
Altres autors: Dolmatov D. O. Dmitry Olegovich, Tarrazo-Serrano D. Daniel, Minin O. V. Oleg Vladilenovich, Sednev D. A. Dmitry Andreevich, Filippov G. A. German Alekseevich, Minin I. V. Igor Vladilenovich
Sumari:Title screen
Currently, phased arrays have found wide application in ultrasonic nondestructive testing. Volumetric results provided by the inspections with linear phased arrays have low lateral resolution in the elevation direction of such probes. This fact complicates the defects characterization task. In this paper, we suggest the application of the Phase-Reversal Fresnel Zone Plate to increase the resolution of volumetric imaging with linear phased arrays. Application of such plates is aimed at ultrasonic focusing in the elevation plane whereas focusing on the active aperture plane is provided by the application of the Sampling Phased Array. Furthermore, the use of the Phase-Reversal Fresnel Zone Plate is advantageous due to the capability of its 3D printing and introduction to the existing automated testing systems avoiding making changes to the current software and hardware. The effectiveness of the plates was verified experimentally on the existing automated testing system. The obtained experimental results demonstrate that the application of the Phase-Reversal Fresnel Zone Plate allowed achieving the results of the higher resolution as well as improving the signal to noise ratio.
Idioma:anglès
Publicat: 2019
Matèries:
Accés en línia:https://doi.org/10.3390/s19235080
Format: Electrònic Capítol de llibre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=661644

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200 1 |a Application of Phase-Reversal Fresnel Zone Plates for Improving The Elevation Resolution in Ultrasonic Testing with Phased Arrays  |f D. O. Dolmatov, D. Tarrazo-Serrano, O. V. Minin [et al.] 
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330 |a Currently, phased arrays have found wide application in ultrasonic nondestructive testing. Volumetric results provided by the inspections with linear phased arrays have low lateral resolution in the elevation direction of such probes. This fact complicates the defects characterization task. In this paper, we suggest the application of the Phase-Reversal Fresnel Zone Plate to increase the resolution of volumetric imaging with linear phased arrays. Application of such plates is aimed at ultrasonic focusing in the elevation plane whereas focusing on the active aperture plane is provided by the application of the Sampling Phased Array. Furthermore, the use of the Phase-Reversal Fresnel Zone Plate is advantageous due to the capability of its 3D printing and introduction to the existing automated testing systems avoiding making changes to the current software and hardware. The effectiveness of the plates was verified experimentally on the existing automated testing system. The obtained experimental results demonstrate that the application of the Phase-Reversal Fresnel Zone Plate allowed achieving the results of the higher resolution as well as improving the signal to noise ratio. 
461 |t Sensors 
463 |t Vol. 19, iss. 23  |v [5080, 13 р.]  |d 2019 
610 1 |a труды учёных ТПУ 
610 1 |a электронный ресурс 
610 1 |a automated ultrasonic phased array inspections 
610 1 |a 3D ultrasonic imaging 
610 1 |a phased array resolution 
610 1 |a Phase-Reversal Fresnel Zone Plate 
610 1 |a ultrasound focusing 
610 1 |a Sampling Phased Array 
610 1 |a 3D 
610 1 |a фокусировка 
701 1 |a Dolmatov  |b D. O.  |c specialist in the field of nuclear technologies  |c technician of Tomsk Polytechnic University  |f 1992-  |g Dmitry Olegovich  |3 (RuTPU)RU\TPU\pers\36911 
701 1 |a Tarrazo-Serrano  |b D.  |g Daniel 
701 1 |a Minin  |b O. V.  |c physicist  |c professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1960-  |g Oleg Vladilenovich  |3 (RuTPU)RU\TPU\pers\44941 
701 1 |a Sednev  |b D. A.  |c specialist in the field of non-destructive testing  |c assistant of Tomsk Polytechnic University, Associate Scientist  |f 1989-  |g Dmitry Andreevich  |3 (RuTPU)RU\TPU\pers\34514 
701 1 |a Filippov  |b G. A.  |c specialist in the field of non-destructive testing  |c assistant of Tomsk Polytechnic University  |f 1991-  |g German Alekseevich  |3 (RuTPU)RU\TPU\pers\36917 
701 1 |a Minin  |b I. V.  |c physicist  |c Senior researcher of Tomsk Polytechnic University, Doctor of technical sciences  |f 1960-  |g Igor Vladilenovich  |3 (RuTPU)RU\TPU\pers\37571 
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