Detection of Insulation Defects in Automated In-Process Testing of Electric Wire during its Extrusion; Materials Science Forum; Vol. 942 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance
| Parent link: | Materials Science Forum: Scientific Journal Vol. 942 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance.— 2019.— [P. 141-150] |
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| Andre forfattere: | , , , |
| Summary: | Title screen The paper describes the electro-capacitive method for monitoring wire capacitance, which is implemented using the CAP-10 device, employed for in-process testing of the single core electric wire capacitance. Focus is made on the operating principle of the CAP-10 device. The possibility of using the CAP-10 device for detecting local defects in wire insulation is proved. Insulation defects such as foreign inclusions in the form of copper shavings, air cavities inside insulation and those at the core–insulation boundary are modeled. The impact of the defect geometric parameters on the wire capacitance measured during in-process testing is investigated through numerical simulation. Mathematical simulation results are validated through the physical model using the CAP-10 device. Режим доступа: по договору с организацией-держателем ресурса |
| Sprog: | engelsk |
| Udgivet: |
2019
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| Fag: | |
| Online adgang: | https://doi.org/10.4028/www.scientific.net/MSF.942.141 |
| Format: | Electronisk Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=661293 |
MARC
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| 200 | 1 | |a Detection of Insulation Defects in Automated In-Process Testing of Electric Wire during its Extrusion |f A. E. Goldstein (Goldshtein) [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 330 | |a The paper describes the electro-capacitive method for monitoring wire capacitance, which is implemented using the CAP-10 device, employed for in-process testing of the single core electric wire capacitance. Focus is made on the operating principle of the CAP-10 device. The possibility of using the CAP-10 device for detecting local defects in wire insulation is proved. Insulation defects such as foreign inclusions in the form of copper shavings, air cavities inside insulation and those at the core–insulation boundary are modeled. The impact of the defect geometric parameters on the wire capacitance measured during in-process testing is investigated through numerical simulation. Mathematical simulation results are validated through the physical model using the CAP-10 device. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 1 | |0 (RuTPU)RU\TPU\network\24092 |t Materials Science Forum |o Scientific Journal | |
| 463 | 1 | |0 (RuTPU)RU\TPU\network\28876 |t Vol. 942 : Modern Problems in Materials Processing, Manufacturing, Testing and Quality Assurance |o January 2019, Tomsk, Russia |f National Research Tomsk Polytechnic University (TPU) ; ed. A. P. Surzhikov |v [P. 141-150] |d 2019 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a capacitance measuring device | |
| 610 | 1 | |a electro-capacitive method | |
| 610 | 1 | |a in-process testing | |
| 610 | 1 | |a insulation defects | |
| 610 | 1 | |a simulation | |
| 610 | 1 | |a измерения | |
| 610 | 1 | |a емкость | |
| 610 | 1 | |a электроемкостные методы | |
| 610 | 1 | |a тестирование | |
| 610 | 1 | |a моделирование | |
| 701 | 1 | |a Goldstein (Goldshtein) |b A. E. |c Specialist in the field of non-destructive testing |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1954- |g Aleksandr Efremovich |3 (RuTPU)RU\TPU\pers\32322 |9 16296 | |
| 701 | 1 | |a Vavilova |b G. V. |c specialist in the field of non-destructive testing |c Head of Laboratory, Associate Professor of Tomsk Polytechnic University, Candidate of Technical Sciences |f 1981- |g Galina Vasilievna |3 (RuTPU)RU\TPU\pers\32607 |9 16520 | |
| 701 | 1 | |a Ryumkin |b A. V. |g Aleksandr Vladimirovich | |
| 701 | 1 | |a Stary |b O. |c Specialist in the field of non-destructive testing |c Senior researcher of Tomsk Polytechnic University, Candidate of economic sciences |f 1960- |g Oldrich |3 (RuTPU)RU\TPU\pers\45340 | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа неразрушающего контроля и безопасности |b Отделение контроля и диагностики |3 (RuTPU)RU\TPU\col\23584 |
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| 856 | 4 | |u https://doi.org/10.4028/www.scientific.net/MSF.942.141 | |
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