Detectability of flat microdefects in radiographic images obtained using linear microfocus bremsstrahlung source based on 18 MeV betatron with narrow target inside; Journal of Physics: Conference Series; Vol. 1327 : Innovations in Non-Destructive Testing (SibTest 2019)
| Parent link: | Journal of Physics: Conference Series Vol. 1327 : Innovations in Non-Destructive Testing (SibTest 2019).— 2019.— [012014, 6 р.] |
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| Autor principal: | |
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| Altres autors: | , |
| Sumari: | Title screen For the determination of ability of microfocus Bremsstrahlung (Bs) source based on B-18 betatron to detect flat microgaps and microinclusions in heavy material products the investigations were carried out. The radiographic images of 10 [mu]m gaps and 13 [mu] m tantalum (Ta) foil into steel bulk which were oriented at different angles with respect to the direction of radiation were investigated. The assembly of four steel blocks having 10 [mu]m gaps between their neighbor surfaces was placed on goniometer. The 13 [mu]m Ta foil having the length of 4 mm along radiation beam was mounted in a plastic holder which was also placed on the goniometer. For modeling narrow gaps and thin inclusions inside the bulk of steel detail, the experimental samples were placed before a thick steel plate. The radiographic images of the samples were obtained with a 2.4-fold magnification at different orientations of narrow gaps and Ta foil with respect to the radiation beam and at the thick steel plates of different thicknesses. The results illustrate high sensitivity of detecting of the microgaps inside steel bulk and flat microinclusions from heavy material in the bulk of detail made from a lighter material due to the microfocus of Bs source. |
| Idioma: | anglès |
| Publicat: |
2019
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| Matèries: | |
| Accés en línia: | https://doi.org/10.1088/1742-6596/1327/1/012014 http://earchive.tpu.ru/handle/11683/57045 |
| Format: | MixedMaterials Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=661272 |
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| 200 | 1 | |a Detectability of flat microdefects in radiographic images obtained using linear microfocus bremsstrahlung source based on 18 MeV betatron with narrow target inside |f M. M. Rychkov, V. V. Kaplin, V. A. Smolyanskiy | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 6 tit.] | ||
| 330 | |a For the determination of ability of microfocus Bremsstrahlung (Bs) source based on B-18 betatron to detect flat microgaps and microinclusions in heavy material products the investigations were carried out. The radiographic images of 10 [mu]m gaps and 13 [mu] m tantalum (Ta) foil into steel bulk which were oriented at different angles with respect to the direction of radiation were investigated. The assembly of four steel blocks having 10 [mu]m gaps between their neighbor surfaces was placed on goniometer. The 13 [mu]m Ta foil having the length of 4 mm along radiation beam was mounted in a plastic holder which was also placed on the goniometer. For modeling narrow gaps and thin inclusions inside the bulk of steel detail, the experimental samples were placed before a thick steel plate. The radiographic images of the samples were obtained with a 2.4-fold magnification at different orientations of narrow gaps and Ta foil with respect to the radiation beam and at the thick steel plates of different thicknesses. The results illustrate high sensitivity of detecting of the microgaps inside steel bulk and flat microinclusions from heavy material in the bulk of detail made from a lighter material due to the microfocus of Bs source. | ||
| 461 | 1 | |0 (RuTPU)RU\TPU\network\3526 |t Journal of Physics: Conference Series | |
| 463 | 1 | |0 (RuTPU)RU\TPU\network\31502 |t Vol. 1327 : Innovations in Non-Destructive Testing (SibTest 2019) |o V International Conference, 26–28 June 2019, Yekaterinburg, Russia |o [proceedings] |f National Research Tomsk Polytechnic University (TPU) |v [012014, 6 р.] |d 2019 | |
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| 610 | 1 | |a рентгенография | |
| 610 | 1 | |a изображения | |
| 610 | 1 | |a микрофокусные источники | |
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| 610 | 1 | |a микровключения | |
| 700 | 1 | |a Rychkov |b M. M. |c physicist |c Head of the laboratory of Tomsk Polytechnic University, Candidate of technical sciences |f 1977- |g Maksim Mikhailovich |3 (RuTPU)RU\TPU\pers\32262 |9 16251 | |
| 701 | 1 | |a Kaplin |b V. V. |c physicist |c senior research fellow at Tomsk Polytechnic University |f 1947- |g Valery Viktorovich |3 (RuTPU)RU\TPU\pers\31532 | |
| 701 | 1 | |a Smolyanskiy |b V. A. |c Specialist in the field of instrument engineering |c Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences |f 1991- |g Vladimir Aleksandrovich |3 (RuTPU)RU\TPU\pers\38302 |9 20730 | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Инженерная школа неразрушающего контроля и безопасности |b Центр промышленной томографии |b Научно-производственная лаборатория "Бетатронная томография крупногабаритных объектов" |3 (RuTPU)RU\TPU\col\23717 |
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