Measurement Affecting Errors in Digital Image Correlation; IOP Conference Series: Materials Science and Engineering; Vol. 511 : Perspective Materials of Constructional and Medical Purpose
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 511 : Perspective Materials of Constructional and Medical Purpose.— 2019.— [012018, 5 p.] |
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| Sumari: | Title screen Optical full-field measurement methods such as Digital Image Correlation (DIC) are increasingly used in the area of experimental mechanics. The reliability for each measurement technique depends on the knowledge of its uncertainty and the sources of errors of the results. The aim of this work is to systemize the sources of errors related to digital image correlation (DIC) technique applied to strain measurements. The paper is concluded by some suggestions proposed in order to minimize the errors. |
| Idioma: | anglès |
| Publicat: |
2019
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| Matèries: | |
| Accés en línia: | http://dx.doi.org/10.1088/1757-899X/511/1/012018 http://earchive.tpu.ru/handle/11683/55444 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660537 |
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| 200 | 1 | |a Measurement Affecting Errors in Digital Image Correlation |f V. V. Titkov, S. V. Panin | |
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| 330 | |a Optical full-field measurement methods such as Digital Image Correlation (DIC) are increasingly used in the area of experimental mechanics. The reliability for each measurement technique depends on the knowledge of its uncertainty and the sources of errors of the results. The aim of this work is to systemize the sources of errors related to digital image correlation (DIC) technique applied to strain measurements. The paper is concluded by some suggestions proposed in order to minimize the errors. | ||
| 461 | 1 | |0 (RuTPU)RU\TPU\network\2008 |t IOP Conference Series: Materials Science and Engineering | |
| 463 | 1 | |0 (RuTPU)RU\TPU\network\29838 |t Vol. 511 : Perspective Materials of Constructional and Medical Purpose |o International Scientific and Technical Youth Conference, 26–30 November 2018, Tomsk, Russian Federation |o [proceedings] |v [012018, 5 p.] |d 2019 | |
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| 700 | 1 | |a Titkov |b V. V. | |
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