Evaluation of Code-Word Subsets to Ensure the Self-Testing Property of a Checker; East-West Design and Test Symposium (EWDTS), 2018 IEEE
| Parent link: | East-West Design and Test Symposium (EWDTS), 2018 IEEE.— 2018.— [6 р.] |
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| その他の著者: | , |
| 要約: | Title screen The method of a self-testing (m, n)-code checker design based on the use of CLBs is considered. CLBs are supposed to be carried out in the framework of LUT-technology. To design the checker, a special expansion formula is used. The set V of checker faults includes all multiple stuck-at faults occurred at CLB inputs. The number l of code words appearing at the inputs of the checker can be less than the number of all possible code words. It implies that some faults of the self-testing checker connected to the outputs of the self-checking circuit can be undetectable. The paper establishes a property of a subset of code words, which allows us to check if a given subset provides the self-testing property of the checker. The property is used in the developed algorithm for analyzing a subset of code words. Режим доступа: по договору с организацией-держателем ресурса |
| 言語: | 英語 |
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2018
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| オンライン･アクセス: | https://doi.org/10.1109/EWDTS.2018.8524847 |
| フォーマット: | 電子媒体 図書の章 |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660241 |