Evaluation of Code-Word Subsets to Ensure the Self-Testing Property of a Checker

Bibliographic Details
Parent link:East-West Design and Test Symposium (EWDTS), 2018 IEEE: proceedings, September 14-17, 2018 Kazan, Russia. [6 р.].— , 2018
Main Author: Butorina N. B. Nataljya Borisovna
Corporate Author: Национальный исследовательский Томский политехнический университет Инженерная школа информационных технологий и робототехники Отделение информационных технологий
Other Authors: Burkatovskaya Yu. B. Yuliya Borisovna, Pakhomova E. G. Elena Grigorievna
Summary:Title screen
The method of a self-testing (m, n)-code checker design based on the use of CLBs is considered. CLBs are supposed to be carried out in the framework of LUT-technology. To design the checker, a special expansion formula is used. The set V of checker faults includes all multiple stuck-at faults occurred at CLB inputs. The number l of code words appearing at the inputs of the checker can be less than the number of all possible code words. It implies that some faults of the self-testing checker connected to the outputs of the self-checking circuit can be undetectable. The paper establishes a property of a subset of code words, which allows us to check if a given subset provides the self-testing property of the checker. The property is used in the developed algorithm for analyzing a subset of code words.
Режим доступа: по договору с организацией-держателем ресурса
Published: 2018
Subjects:
Online Access:https://doi.org/10.1109/EWDTS.2018.8524847
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660241

MARC

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200 1 |a Evaluation of Code-Word Subsets to Ensure the Self-Testing Property of a Checker  |f N. B. Butorina, Yu. B. Burkatovskaya, E. G. Pakhomova 
203 |a Text  |c electronic 
300 |a Title screen 
330 |a The method of a self-testing (m, n)-code checker design based on the use of CLBs is considered. CLBs are supposed to be carried out in the framework of LUT-technology. To design the checker, a special expansion formula is used. The set V of checker faults includes all multiple stuck-at faults occurred at CLB inputs. The number l of code words appearing at the inputs of the checker can be less than the number of all possible code words. It implies that some faults of the self-testing checker connected to the outputs of the self-checking circuit can be undetectable. The paper establishes a property of a subset of code words, which allows us to check if a given subset provides the self-testing property of the checker. The property is used in the developed algorithm for analyzing a subset of code words. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
463 |t East-West Design and Test Symposium (EWDTS), 2018 IEEE  |o proceedings, September 14-17, 2018 Kazan, Russia  |v [6 р.]  |d 2018 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a circuit faults 
610 1 |a built-in self-test 
610 1 |a complexity theory 
610 1 |a integrated circuit reliability 
610 1 |a boolean functions 
610 1 |a detectors 
610 1 |a неисправности 
610 1 |a самопроверка 
610 1 |a интегральные схемы 
610 1 |a детекторы 
700 1 |a Butorina  |b N. B.  |g Nataljya Borisovna 
701 1 |a Burkatovskaya  |b Yu. B.  |c mathematician  |c associate Professor of Tomsk Polytechnic University, candidate of physico-mathematical Sciences  |f 1973-  |g Yuliya Borisovna  |3 (RuTPU)RU\TPU\pers\36259  |9 19335 
701 1 |a Pakhomova  |b E. G.  |c mathematician  |c Associate Professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1945-  |g Elena Grigorievna  |3 (RuTPU)RU\TPU\pers\37064 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа информационных технологий и робототехники  |b Отделение информационных технологий  |3 (RuTPU)RU\TPU\col\23515 
801 2 |a RU  |b 63413507  |c 20190515  |g RCR 
856 4 |u https://doi.org/10.1109/EWDTS.2018.8524847 
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