Evaluation of Code-Word Subsets to Ensure the Self-Testing Property of a Checker

Evaluation of Code-Word Subsets to Ensure the Self-Testing Property of a Checker

Bibliographic Details
Parent link:East-West Design and Test Symposium (EWDTS), 2018 IEEE: proceedings, September 14-17, 2018 Kazan, Russia. [6 р.].— , 2018
Main Author: Butorina N. B. Nataljya Borisovna
Corporate Author: Национальный исследовательский Томский политехнический университет Инженерная школа информационных технологий и робототехники Отделение информационных технологий
Other Authors: Burkatovskaya Yu. B. Yuliya Borisovna, Pakhomova E. G. Elena Grigorievna
Summary:Title screen
The method of a self-testing (m, n)-code checker design based on the use of CLBs is considered. CLBs are supposed to be carried out in the framework of LUT-technology. To design the checker, a special expansion formula is used. The set V of checker faults includes all multiple stuck-at faults occurred at CLB inputs. The number l of code words appearing at the inputs of the checker can be less than the number of all possible code words. It implies that some faults of the self-testing checker connected to the outputs of the self-checking circuit can be undetectable. The paper establishes a property of a subset of code words, which allows us to check if a given subset provides the self-testing property of the checker. The property is used in the developed algorithm for analyzing a subset of code words.
Режим доступа: по договору с организацией-держателем ресурса
Published: 2018
Subjects:
электронный ресурс
труды учёных ТПУ
circuit faults
built-in self-test
complexity theory
integrated circuit reliability
boolean functions
detectors
неисправности
самопроверка
интегральные схемы
детекторы
Online Access:https://doi.org/10.1109/EWDTS.2018.8524847
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=660241
Description
Summary:Title screen
The method of a self-testing (m, n)-code checker design based on the use of CLBs is considered. CLBs are supposed to be carried out in the framework of LUT-technology. To design the checker, a special expansion formula is used. The set V of checker faults includes all multiple stuck-at faults occurred at CLB inputs. The number l of code words appearing at the inputs of the checker can be less than the number of all possible code words. It implies that some faults of the self-testing checker connected to the outputs of the self-checking circuit can be undetectable. The paper establishes a property of a subset of code words, which allows us to check if a given subset provides the self-testing property of the checker. The property is used in the developed algorithm for analyzing a subset of code words.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.1109/EWDTS.2018.8524847

Similar Items