Calculation of macrodefects coordinates in dielectric specimens on the two-dimensional mathematical model of mechanoeletric transformations method; IOP Conference Series: Materials Science and Engineering; Vol. 457 : Modern Technologies for Non-Destructive Testing
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 457 : Modern Technologies for Non-Destructive Testing.— 2019.— [012020, 5 p.] |
|---|---|
| Autore principale: | |
| Ente Autore: | |
| Altri autori: | , |
| Riassunto: | Title screen Two-dimensional mathematical model of dielectric specimen was used to determine the capability of mechanoelectrical transformations (MET) method to localize macrodefects. Amplitude and phase characteristics of response signal analytical representation were used as response parameters. Three different types of short radiofrequency pulses were chosen for the excitation. A short sin curve of a single period interval is most useful to search the position of the defect, whilst pulses of higher frequencies and are better for location depth evaluation. |
| Lingua: | inglese |
| Pubblicazione: |
2019
|
| Soggetti: | |
| Accesso online: | http://dx.doi.org/10.1088/1757-899X/457/1/012020 http://earchive.tpu.ru/handle/11683/53002 |
| Natura: | Elettronico Capitolo di libro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659654 |
MARC
| LEADER | 00000nla2a2200000 4500 | ||
|---|---|---|---|
| 001 | 659654 | ||
| 005 | 20240130124415.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\28323 | ||
| 035 | |a RU\TPU\network\28316 | ||
| 090 | |a 659654 | ||
| 100 | |a 20190313d2019 k y0engy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a GB | ||
| 105 | |a y z 100zy | ||
| 135 | |a vrgn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Calculation of macrodefects coordinates in dielectric specimens on the two-dimensional mathematical model of mechanoeletric transformations method |f R. A. Laas, P. N. Khorsov, A. P. Surzhikov | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 8 tit.] | ||
| 330 | |a Two-dimensional mathematical model of dielectric specimen was used to determine the capability of mechanoelectrical transformations (MET) method to localize macrodefects. Amplitude and phase characteristics of response signal analytical representation were used as response parameters. Three different types of short radiofrequency pulses were chosen for the excitation. A short sin curve of a single period interval is most useful to search the position of the defect, whilst pulses of higher frequencies and are better for location depth evaluation. | ||
| 461 | 1 | |0 (RuTPU)RU\TPU\network\2008 |t IOP Conference Series: Materials Science and Engineering | |
| 463 | 1 | |0 (RuTPU)RU\TPU\network\28312 |t Vol. 457 : Modern Technologies for Non-Destructive Testing |o VII International Conference, 8–13 October 2018, Tomsk, Russian Federation |o [proceedings] |v [012020, 5 p.] |d 2019 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a координаты | |
| 610 | 1 | |a дефекты | |
| 610 | 1 | |a диэлектрические образцы | |
| 610 | 1 | |a двумерные модели | |
| 610 | 1 | |a математические модели | |
| 610 | 1 | |a механоэлектрические преобразования | |
| 610 | 1 | |a сигналы | |
| 610 | 1 | |a импульсы | |
| 700 | 1 | |a Laas |b R. A. |c Physicist |c Assistant of the Department of Tomsk Polytechnic University |f 1991- |g Roman Aleksandrovich |3 (RuTPU)RU\TPU\pers\35139 |9 18414 | |
| 701 | 1 | |a Khorsov |b P. N. |c specialist in the field of non-destructive testing |c senior researcher of Tomsk Polytechnic University |f 1986- |g Petr Nikolaevich |3 (RuTPU)RU\TPU\pers\34578 | |
| 701 | 1 | |a Surzhikov |b A. P. |c physicist |c Professor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc) |f 1951- |g Anatoly Petrovich |3 (RuTPU)RU\TPU\pers\30237 |9 14617 | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Институт неразрушающего контроля (ИНК) |b Проблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП) |3 (RuTPU)RU\TPU\col\19033 |
| 801 | 1 | |a RU |b 63413507 |c 20150101 |g RCR | |
| 801 | 2 | |a RU |b 63413507 |c 20190319 |g RCR | |
| 856 | 4 | |u http://dx.doi.org/10.1088/1757-899X/457/1/012020 | |
| 856 | 4 | |u http://earchive.tpu.ru/handle/11683/53002 | |
| 942 | |c CF | ||