Effect of Mechanical Load on Defects Level in Soft Ferrite Ceramics
| Parent link: | European Physical Journal Web of Conferences (EPJ Web of Conferences) Vol. 186 : Engineering Mathematics and Physics (ICEMP 2018).— 2018.— [02010, 4 р.] |
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| Autor principal: | |
| Autor corporatiu: | |
| Altres autors: | , |
| Sumari: | Title screen The article presents the results of a study of the effect of mechanical load on the temperature dependence of the initial permeability of LiTiZn soft ferrite ceramics. Regimes of mechanical load were created by a steel non-magnetic ring with screws. In this work, four levels of mechanical load were investigated: without load, with 1, 2 and 3 screws. For obtaining temperature dependences and exclude the influence of prehistory on the initial permeability, the samples were heated to a temperature exceeding the Curie point by 50 degrees, after which they slowly cooled to room temperature. The defects level was determined by the ratio of the parameters ? / ? of the phenomenological expression, which describes the experimental temperature dependences. It is shown that as the mechanical load increases, the defects level of ferrite ceramics increases, and after load removing, it returns to its original level. |
| Idioma: | anglès |
| Publicat: |
2018
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| Matèries: | |
| Accés en línia: | https://doi.org/10.1051/matecconf/201818602010 http://earchive.tpu.ru/handle/11683/57824 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659616 |
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| 200 | 1 | |a Effect of Mechanical Load on Defects Level in Soft Ferrite Ceramics |f A. B. Petrova, A. V. Malyshev, A. P. Surzhikov | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 11 tit.] | ||
| 330 | |a The article presents the results of a study of the effect of mechanical load on the temperature dependence of the initial permeability of LiTiZn soft ferrite ceramics. Regimes of mechanical load were created by a steel non-magnetic ring with screws. In this work, four levels of mechanical load were investigated: without load, with 1, 2 and 3 screws. For obtaining temperature dependences and exclude the influence of prehistory on the initial permeability, the samples were heated to a temperature exceeding the Curie point by 50 degrees, after which they slowly cooled to room temperature. The defects level was determined by the ratio of the parameters ? / ? of the phenomenological expression, which describes the experimental temperature dependences. It is shown that as the mechanical load increases, the defects level of ferrite ceramics increases, and after load removing, it returns to its original level. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\7958 |t European Physical Journal Web of Conferences (EPJ Web of Conferences) | |
| 463 | |t Vol. 186 : Engineering Mathematics and Physics (ICEMP 2018) |o 7th International Conference, Prague, Czech Republic, June 15-18, 2018 |v [02010, 4 р.] |d 2018 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a механические нагрузки | |
| 610 | 1 | |a ферритовая керамика | |
| 610 | 1 | |a температурные зависимости | |
| 700 | 1 | |a Petrova |b A. B. |c specialist in the field of non-destructive testing |c Associate Scientist of Tomsk Polytechnic University |f 1992- |g Anna Borisovna |3 (RuTPU)RU\TPU\pers\36438 | |
| 701 | 1 | |a Malyshev |b A. V. |c Specialist in the field of electrical engineering |c Senior researcher at Tomsk Polytechnic University, Candidate of Physics and Mathematics (PhD Phys.-Math.) |f 1978- |g Andrei Vladimirovich |3 (RuTPU)RU\TPU\pers\30965 |9 15203 | |
| 701 | 1 | |a Surzhikov |b A. P. |c physicist |c Professor of Tomsk Polytechnic University, doctor of physical and mathematical sciences (DSc) |f 1951- |g Anatoly Petrovich |3 (RuTPU)RU\TPU\pers\30237 | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Институт неразрушающего контроля (ИНК) |b Проблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП) |3 (RuTPU)RU\TPU\col\19033 |
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