Selecting Parameters of Detectors When Recognizing Materials Based on the Separation of Soft and Hard X-Ray Components

Selecting Parameters of Detectors When Recognizing Materials Based on the Separation of Soft and Hard X-Ray Components

Bibliographic Details
Parent link:Russian Journal of Nondestructive Testing
Vol. 54, iss. 11.— 2018.— [P. 797–810]
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Российско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД)
Other Authors: Osipov S. P. Sergey Pavlovich, Usachev E. Yu. Evgeny Yurjevich, Chakhlov S. V. Sergey Vladimirovich, Shchetinkin S. A. Sergey Aleksandrovich, Kamysheva E. N. Ekaterina Nikolaevna
Summary:Title screen
An approach to choosing the materials and thicknesses of detectors and an intermediate filter is considered in a material recognition method based on single X-raying of a test object with separate detection of soft and hard photons. The approach combines the maximum sensitivity to changes in the effective atomic number and the minimum error of its estimation. An example is given of selecting the parameters of the detectors and intermediate filter for X-ray energies in the range from 100 to 300 keV.
Режим доступа: по договору с организацией-держателем ресурса
Published: 2018
Subjects:
электронный ресурс
труды учёных ТПУ
рентгеновское излучение
атомный номер
инспекционный контроль
метод дуальных энергий
Online Access:https://doi.org/10.1134/S1061830918110074
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659345

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