Selecting Parameters of Detectors When Recognizing Materials Based on the Separation of Soft and Hard X-Ray Components; Russian Journal of Nondestructive Testing; Vol. 54, iss. 11
| Parent link: | Russian Journal of Nondestructive Testing Vol. 54, iss. 11.— 2018.— [P. 797–810] |
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| Autor Corporativo: | |
| Outros Autores: | , , , , |
| Resumo: | Title screen An approach to choosing the materials and thicknesses of detectors and an intermediate filter is considered in a material recognition method based on single X-raying of a test object with separate detection of soft and hard photons. The approach combines the maximum sensitivity to changes in the effective atomic number and the minimum error of its estimation. An example is given of selecting the parameters of the detectors and intermediate filter for X-ray energies in the range from 100 to 300 keV. Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | inglês |
| Publicado em: |
2018
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| Assuntos: | |
| Acesso em linha: | https://doi.org/10.1134/S1061830918110074 |
| Formato: | Recurso Electrónico Capítulo de Livro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659345 |