Properties of Nanocomposite Nickel-Carbon Films Deposited by Magnetron Sputtering; Russian Physics Journal; Vol. 60, iss. 8

Xehetasun bibliografikoak
Parent link:Russian Physics Journal
Vol. 60, iss. 8.— 2018.— [P. 1029-1033]
Erakunde egilea: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Научная лаборатория высокоинтенсивной имплантации ионов
Beste egile batzuk: Grenaderov A. S. Aleksandr Sergeevich, Oskomov K. V. Konstantin Vladimirovich, Soloviev A. A. Andrey Aleksandrovich, Rabotkin S. V. Sergey Viktorovich, Zakharov A. N. Aleksandr Nikolaevich, Semyonov V. A. Vladimir Aleksandrovich, Oskirko V. O. Vladimir Olegovich, Elgin Y. I. Yury Igorevich, Korneva O. S. Olga Sergeevna
Gaia:Title screen
The method of magnetron sputtering was used to produce a-C and a-C:Ni films on substrates of monocrystalline silicon and thermoelectric material of n-type ((Bi2Te3)0.94(Bi2Se3)0.06) and p-type ((Bi2Te3)0.20(Sb2Te3)0.80) conductivity. The authors studied the effect of Ni concentration on specific electric resistance, hardness and adhesion of the produced films. It was demonstrated that specific resistance of a-C films deposited by graphite target sputtering when supplying high bias voltage onto the substrate can be reduced by increasing the share of graphitized carbon. Adding Ni to such films allows additionally reducing their specific resistance. The increase in Ni content is accompanied with the decrease in hardness and adhesion of a-C:Ni films. The acquired values of specific electric resistance and adhesion of a-C:Ni films to thermoelectric materials allow using them as barrier anti-diffusion coatings of thermoelectric modules.
Режим доступа: по договору с организацией-держателем ресурса
Hizkuntza:ingelesa
Argitaratua: 2018
Gaiak:
Sarrera elektronikoa:https://doi.org/10.1007/s11182-017-1209-1
Formatua: Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659068

MARC

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200 1 |a Properties of Nanocomposite Nickel-Carbon Films Deposited by Magnetron Sputtering  |f A. S. Grenaderov [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 21 tit.] 
330 |a The method of magnetron sputtering was used to produce a-C and a-C:Ni films on substrates of monocrystalline silicon and thermoelectric material of n-type ((Bi2Te3)0.94(Bi2Se3)0.06) and p-type ((Bi2Te3)0.20(Sb2Te3)0.80) conductivity. The authors studied the effect of Ni concentration on specific electric resistance, hardness and adhesion of the produced films. It was demonstrated that specific resistance of a-C films deposited by graphite target sputtering when supplying high bias voltage onto the substrate can be reduced by increasing the share of graphitized carbon. Adding Ni to such films allows additionally reducing their specific resistance. The increase in Ni content is accompanied with the decrease in hardness and adhesion of a-C:Ni films. The acquired values of specific electric resistance and adhesion of a-C:Ni films to thermoelectric materials allow using them as barrier anti-diffusion coatings of thermoelectric modules. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 1 |t Russian Physics Journal 
463 1 |t Vol. 60, iss. 8  |v [P. 1029-1033]  |d 2018 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a amorphous carbon films 
610 1 |a thermoelectric converters 
610 1 |a anti-diffusion layer 
610 1 |a conductivity 
610 1 |a hardness 
610 1 |a adhesion 
610 1 |a пленки 
610 1 |a аморфный углерод 
610 1 |a термоэлектрические преобразователи 
610 1 |a проводимость 
610 1 |a твердость 
610 1 |a адгезия 
701 1 |a Grenaderov  |b A. S.  |g Aleksandr Sergeevich 
701 1 |a Oskomov  |b K. V.  |g Konstantin Vladimirovich 
701 1 |a Soloviev  |b A. A.  |c specialist in the field of hydrogen energy  |c Associate Professor of Tomsk Polytechnic University, Candidate of technical sciences  |f 1977-  |g Andrey Aleksandrovich  |3 (RuTPU)RU\TPU\pers\30863 
701 1 |a Rabotkin  |b S. V.  |g Sergey Viktorovich 
701 1 |a Zakharov  |b A. N.  |g Aleksandr Nikolaevich 
701 1 |a Semyonov  |b V. A.  |g Vladimir Aleksandrovich 
701 1 |a Oskirko  |b V. O.  |g Vladimir Olegovich 
701 1 |a Elgin  |b Y. I.  |g Yury Igorevich 
701 1 |a Korneva  |b O. S.  |c physicist  |c engineer of Tomsk Polytechnic University  |f 1988-  |g Olga Sergeevna  |3 (RuTPU)RU\TPU\pers\37178  |9 20156 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа ядерных технологий  |b Научная лаборатория высокоинтенсивной имплантации ионов  |3 (RuTPU)RU\TPU\col\23698 
801 2 |a RU  |b 63413507  |c 20191125  |g RCR 
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