Estimation of Parameters of Digital Radiography Systems; IEEE Transactions on Nuclear Science; Vol. 65, iss. 10

Dades bibliogràfiques
Parent link:IEEE Transactions on Nuclear Science
Vol. 65, iss. 10.— 2018.— [P. 2732-2742]
Autor corporatiu: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Проблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП), Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Российско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД)
Altres autors: Osipov S. P. Sergey Pavlovich, Zhang Gaolong, Chakhlov S. V. Sergey Vladimirovich, Shtein M. M. Mikhail Mikhailovich, Stein A. M. Aleksandr Mikhailovich, Chin Van Bac, Sirotjyan E. V. Evgeniya Vladimirovna
Sumari:Title screen
Based on the test object and the given data from the detectors, a set of formulas connecting the characteristics of digital radiography (DR) systems with the parameters of the X-ray radiation source is checked. The obtained formulas can give a rational choice of the source and the X-ray detector for a nondestructive test. A series of calculations for the DR characteristics of systems based on the CdWO 4 panel detectors with the 0.3-mm thickness for medium and high X-ray energies was carried out. A series of experiments was carried out to determine the X-ray attenuation rate with the maximum energies of 4.5 and 9 MeV for steel plates with a mass thickness from 20 to 80 g/cm 2 . A comparison of the experimental and calculated data on the attenuation rate showed a good convergence for the range of mass thicknesses of the test object fragments. The calculation results and the results of experimental studies prove the correctness of the proposed method for calculating and evaluating the basic parameters of DR systems under the condition of rigid slit collimation of X-ray radiation for inspection of large objects from highly scattering materials.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:anglès
Publicat: 2018
Matèries:
Accés en línia:https://doi.org/10.1109/TNS.2018.2870162
Format: MixedMaterials Electrònic Capítol de llibre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=659025

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200 1 |a Estimation of Parameters of Digital Radiography Systems  |f S. P. Osipov [et al.] 
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330 |a Based on the test object and the given data from the detectors, a set of formulas connecting the characteristics of digital radiography (DR) systems with the parameters of the X-ray radiation source is checked. The obtained formulas can give a rational choice of the source and the X-ray detector for a nondestructive test. A series of calculations for the DR characteristics of systems based on the CdWO 4 panel detectors with the 0.3-mm thickness for medium and high X-ray energies was carried out. A series of experiments was carried out to determine the X-ray attenuation rate with the maximum energies of 4.5 and 9 MeV for steel plates with a mass thickness from 20 to 80 g/cm 2 . A comparison of the experimental and calculated data on the attenuation rate showed a good convergence for the range of mass thicknesses of the test object fragments. The calculation results and the results of experimental studies prove the correctness of the proposed method for calculating and evaluating the basic parameters of DR systems under the condition of rigid slit collimation of X-ray radiation for inspection of large objects from highly scattering materials. 
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463 1 |t Vol. 65, iss. 10  |v [P. 2732-2742]  |d 2018 
610 1 |a труды учёных ТПУ 
610 1 |a электронный ресурс 
610 1 |a computed tomography 
610 1 |a gamma-ray effects 
610 1 |a radiography 
610 1 |a X-ray detectors 
610 1 |a компьютерная томография 
610 1 |a гамма-частицы 
610 1 |a радиография 
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701 1 |a Osipov  |b S. P.  |c specialist in the field of non-destructive testing  |c Leading researcher of Tomsk Polytechnic University, candidate of technical sciences  |f 1958-  |g Sergey Pavlovich  |3 (RuTPU)RU\TPU\pers\35098  |9 18373 
701 0 |a Zhang Gaolong 
701 1 |a Chakhlov  |b S. V.  |c physicist  |c Head of the laboratory of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1956-  |g Sergey Vladimirovich  |3 (RuTPU)RU\TPU\pers\34254  |9 17785 
701 1 |a Shtein  |b M. M.  |c Physicist  |c Head of Laboratory at Tomsk Polytechnic University, Candidate of technical sciences  |f 1938-  |g Mikhail Mikhailovich  |3 (RuTPU)RU\TPU\pers\31482 
701 1 |a Stein  |b A. M.  |c physicist  |c engineer of Tomsk Polytechnic University  |f 1986-  |g Aleksandr Mikhailovich  |3 (RuTPU)RU\TPU\pers\34573  |9 17935 
701 0 |a Chin Van Bac  |c specialist in the field of non-destructive testing  |c Research Engineer of Tomsk Polytechnic University  |f 1989-  |3 (RuTPU)RU\TPU\pers\42598 
701 1 |a Sirotjyan  |b E. V.  |g Evgeniya Vladimirovna 
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