Deposition of Cr films by hot target magnetron sputtering on biased substrates

Detaylı Bibliyografya
Parent link:Surface and Coatings Technology
Vol. 350.— 2018.— [P. 560-568]
Müşterek Yazar: Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Научно-образовательный центр Б. П. Вейнберга
Diğer Yazarlar: Sidelev D. V. Dmitry Vladimirovich, Bestetti M. Massimiliano, Bleykher (Bleicher) G. A. Galina Alekseevna, Krivobokov V. P. Valery Pavlovich, Grudinin V. A. Vladislav Alekseevich, Franz S. Silvia, Vicenzo A. Antonello, Shanenkova Yu. L. Yuliya Leonidovna
Özet:Title screen
The Cr films were deposited by hot target magnetron sputtering on grounded and biased substrates. The deposition modes with low and high deposition rates (different by 4 times) were selected. The sublimation of hot Cr target decreased the re-sputtering effect of the growing films under ion bombardment and reduced the losses of deposition rate from 28.7 to 13.4% (for −40 V bias and 1.9 kW discharge power). The calculations of energy flux densityon the substrate revealed that the major contribution has a target radiation (56.2…85.5%) and kinetic energy of deposited particles and ions (4.8…34.3%) become a significant only with substrate biasing. The XRD measurements showed cubic structured (110) Cr films with compressive stresses (0.48…0.90 GPa), which is non-dependent from bias voltage for high-rate deposition modes. The Cr films mainly had a columnar structure and columnar width increased from 50 to 450 nm with rise of discharge power (W). The substrate biasing and high deposition rate resulted in the formation of irregular microstructure of the Cr films along their thickness from porous to columnar state. The indentation tests showed the strong dependence of film hardness and toughness (H/E) from W and different behavior of the mechanical properties of the Cr films for the deposition on biased substrates with low and high deposition rates.
AM_Agreement
Dil:İngilizce
Baskı/Yayın Bilgisi: 2018
Konular:
Online Erişim:https://doi.org/10.1016/j.surfcoat.2018.07.047
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=658948

MARC

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200 1 |a Deposition of Cr films by hot target magnetron sputtering on biased substrates  |f D. V. Sidelev [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: 49 tit.] 
330 |a The Cr films were deposited by hot target magnetron sputtering on grounded and biased substrates. The deposition modes with low and high deposition rates (different by 4 times) were selected. The sublimation of hot Cr target decreased the re-sputtering effect of the growing films under ion bombardment and reduced the losses of deposition rate from 28.7 to 13.4% (for −40 V bias and 1.9 kW discharge power). The calculations of energy flux densityon the substrate revealed that the major contribution has a target radiation (56.2…85.5%) and kinetic energy of deposited particles and ions (4.8…34.3%) become a significant only with substrate biasing. The XRD measurements showed cubic structured (110) Cr films with compressive stresses (0.48…0.90 GPa), which is non-dependent from bias voltage for high-rate deposition modes. The Cr films mainly had a columnar structure and columnar width increased from 50 to 450 nm with rise of discharge power (W). The substrate biasing and high deposition rate resulted in the formation of irregular microstructure of the Cr films along their thickness from porous to columnar state. The indentation tests showed the strong dependence of film hardness and toughness (H/E) from W and different behavior of the mechanical properties of the Cr films for the deposition on biased substrates with low and high deposition rates. 
371 0 |a AM_Agreement 
461 1 |t Surface and Coatings Technology 
463 1 |t Vol. 350  |v [P. 560-568]  |d 2018 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a hot target sputtering 
610 1 |a Cr film 
610 1 |a substrate bias 
610 1 |a structure 
610 1 |a mechanical properties 
610 1 |a распыление 
610 1 |a смещения 
610 1 |a субстраты 
610 1 |a механические характеристики 
701 1 |a Sidelev  |b D. V.  |c physicist  |c engineer of Tomsk Polytechnic University  |f 1991-  |g Dmitry Vladimirovich  |3 (RuTPU)RU\TPU\pers\34524  |9 17905 
701 1 |a Bestetti  |b M.  |c physicist  |c Researcher of Tomsk Polytechnic University  |f 1965-  |g Massimiliano  |3 (RuTPU)RU\TPU\pers\37134  |9 20127 
701 1 |a Bleykher (Bleicher)  |b G. A.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of Physical and Mathematical Sciences  |f 1961-  |g Galina Alekseevna  |3 (RuTPU)RU\TPU\pers\31496  |9 15657 
701 1 |a Krivobokov  |b V. P.  |c Russian physicist  |c professor of Tomsk Polytechnic University (TPU), Doctor of Physical and Mathematical Sciences (DSc)  |f 1948-  |g Valery Pavlovich  |3 (RuTPU)RU\TPU\pers\30416  |9 14757 
701 1 |a Grudinin  |b V. A.  |c physicist  |c engineer of Tomsk Polytechnic University  |f 1995-  |g Vladislav Alekseevich  |3 (RuTPU)RU\TPU\pers\42519  |9 21548 
701 1 |a Franz  |b S.  |g Silvia 
701 1 |a Vicenzo  |b A.  |g Antonello 
701 1 |a Shanenkova  |b Yu. L.  |c specialist in the field of electric power engineering  |c Associate Professor of Tomsk Polytechnic University, Candidate of Technical Sciences  |f 1991-  |g Yuliya Leonidovna  |3 (RuTPU)RU\TPU\pers\34119  |9 17659 
712 0 2 |a Национальный исследовательский Томский политехнический университет  |b Инженерная школа ядерных технологий  |b Научно-образовательный центр Б. П. Вейнберга  |3 (RuTPU)RU\TPU\col\23561  |9 28358 
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