$X-Ray Diffraction Analysis of the Influence of the Absorbed γ-Irradiation Dose on Ti3Al Structural Characteristics; Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques; Vol. 12, iss. 3$

X-Ray Diffraction Analysis of the Influence of the Absorbed γ-Irradiation Dose on Ti3Al Structural Characteristics; Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques; Vol. 12, iss. 3

Dades bibliogràfiques
Parent link:	Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques Vol. 12, iss. 3.— 2018.— [P. 480-484]
Autor corporatiu:	Национальный исследовательский Томский политехнический университет Исследовательская школа физики высокоэнергетических процессов, Национальный исследовательский Томский политехнический университет Инженерная школа неразрушающего контроля и безопасности Отделение контроля и диагностики
Altres autors:	Loginova M. V. Marina Vladimirovna, Yakovlev V. I. Vladimir Ivanovich, Sitnikov A. A. Aleksandr Andreevich, Filimonov V. Yu. Valery Yurjevich, Sobachkin A. V. Aleksey Viktorovich, Ivanov S. G. Sergey Gennadjevich, Gradoboev A. V. Aleksandr Vasilyevich
Sumari:	Title screen The influence of absorbed γ-quantum irradiation doses Dγ (60Co isotope) on the structural parameters of Ti3Al single-phase compounds is experimentally investigated. The structural characteristics are defined more accurately using X-ray diffractometry. On account of the results of structural studies, it is found that exposure to low γ-radiation doses (e.g., Dγ = 1 × 103Gy) generates the nonequilibrium state of the Ti3Al structure. An increase in the absorbed dose (to Dγ = 1 × 105 Gy) stimulates the formation of a metastable radiation-induced state, which is identified by diffraction-reflection splitting, an increase in the crystal-lattice volume, and changes in the parameters of the fine structure (the coherent-scattering-region size decreases to 13 nm, and the defect concentration increases). Режим доступа: по договору с организацией-держателем ресурса
Idioma:	anglès
Publicat:	2018
Matèries:	электронный ресурс труды учёных ТПУ гамма-облучение рентгеновская дифрактометрия кристаллическая решетка когерентное рассеяние микронапряжения
Accés en línia:	https://doi.org/10.1134/S1027451018030126
Format:	Electrònic Capítol de llibre
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=658822

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