Coefficients of Aluminum Diffusion into Zirconium Dioxide Determined by the Method of Secondary-Ion Mass Spectrometry; Russian Physics Journal; Vol. 60, iss. 12
| Parent link: | Russian Physics Journal Vol. 60, iss. 12.— 2018.— [P. 812–816] |
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| Hovedforfatter: | |
| Corporate Authors: | , |
| Andre forfattere: | , |
| Summary: | Title screen The diffusion of aluminum ions into zirconium ceramics synthesized from plasma chemical 97ZrO2–3Y2O3 (mol.%) powders is studied by the method of secondary-ion mass spectrometry using a spectrometer PHI 6300. A thin aluminum film deposited on the ceramic surface was preliminary exposed to intermediate annealing at a temperature of 873 K until its full oxidation. Diffusion annealing was performed at temperatures in the range 1520–1820 K. It is established that the typical experimental depth profile of the impurity distribution has two characteristic linear segments with different slope angles. This demonstrates that the diffusion transfer of aluminum ions proceeds simultaneously in the grain volumes and along the grain boundaries. The volume diffusion coefficients are obtained via approximation of the diffusion profiles by solving the Fick equation for diffusion from a thin-film source into a semi-infinite crystal. The obtained values of the diffusion coefficient are in satisfactory agreement with the available literature data. Режим доступа: по договору с организацией-держателем ресурса |
| Sprog: | engelsk |
| Udgivet: |
2018
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| Fag: | |
| Online adgang: | https://doi.org/10.1007/s11182-017-1143-2 |
| Format: | MixedMaterials Electronisk Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=658507 |
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| 200 | 1 | |a Coefficients of Aluminum Diffusion into Zirconium Dioxide Determined by the Method of Secondary-Ion Mass Spectrometry |f S. A. Gyngazov (Ghyngazov), A. V. Chernyavski (Chernyavskiy), A. B. Petrova | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 17 tit.] | ||
| 330 | |a The diffusion of aluminum ions into zirconium ceramics synthesized from plasma chemical 97ZrO2–3Y2O3 (mol.%) powders is studied by the method of secondary-ion mass spectrometry using a spectrometer PHI 6300. A thin aluminum film deposited on the ceramic surface was preliminary exposed to intermediate annealing at a temperature of 873 K until its full oxidation. Diffusion annealing was performed at temperatures in the range 1520–1820 K. It is established that the typical experimental depth profile of the impurity distribution has two characteristic linear segments with different slope angles. This demonstrates that the diffusion transfer of aluminum ions proceeds simultaneously in the grain volumes and along the grain boundaries. The volume diffusion coefficients are obtained via approximation of the diffusion profiles by solving the Fick equation for diffusion from a thin-film source into a semi-infinite crystal. The obtained values of the diffusion coefficient are in satisfactory agreement with the available literature data. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 1 | |t Russian Physics Journal | |
| 463 | 1 | |t Vol. 60, iss. 12 |v [P. 812–816] |d 2018 | |
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| 610 | 1 | |a примеси | |
| 700 | 1 | |a Gyngazov (Ghyngazov) |b S. A. |c specialist in the field of electronics |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1958- |g Sergey Anatolievich |3 (RuTPU)RU\TPU\pers\33279 |9 17024 | |
| 701 | 1 | |a Chernyavski (Chernyavskiy) |b A. V. |c specialist in the field of electronics |c senior researcher of Tomsk Polytechnic University, candidate of physico-mathematical sciences |f 1966- |g Aleksandr Viktorovich |3 (RuTPU)RU\TPU\pers\34159 | |
| 701 | 1 | |a Petrova |b A. B. |c specialist in the field of non-destructive testing |c Associate Scientist of Tomsk Polytechnic University |f 1992- |g Anna Borisovna |3 (RuTPU)RU\TPU\pers\36438 | |
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