Electrophysical Properties of Ge–Sb–Te Thin Films for Phase Change Memory Devices; Russian Physics Journal; Vol. 59, iss. 9

Detalles Bibliográficos
Parent link:Russian Physics Journal
Vol. 59, iss. 9.— 2017.— [P. 1417-1424]
Autor Corporativo: Национальный исследовательский Томский политехнический университет (ТПУ) Юргинский технологический институт (филиал) (ЮТИ) Кафедра безопасности жизнедеятельности, экологии и физического воспитания (БЖДЭФВ)
Outros autores: Lazarenko P. I. Petr Ivanovich, Kozyukhin S. A. Sergey Aleksandrovich, Sherchenkov A. A. Aleksey Anatoljevich, Babich A. V. Aleksey Valterovich, Timoshenkov S. P. Sergey Petrovich, Gromov D. G. Dmitry Gennadjevich, Zabolotskaya A. V. Anastasiya Vladimirovna, Kozik V. V. Vladimir Vasilievich
Summary:Title screen
In this work, we studied temperature dependences of the resistivity and current-voltage characteristics of amorphous thin films based on the materials of a Ge-Sb-Te system of compositions GeSb4Te7 (GST147), GeSb2Te4 (GST124), and Ge2Sb2Te5 (GST225) applied in the phase change memory devices. The effect of changes in the composition of thin films on the crystallization temperature, resistivity of films in amorphous and crystalline states, and on the activation energy of conductivity is determined. It is found that the peculiarity of these materials is the mechanism of two-channel conductivity where the contribution to the conductivity is made by charge carriers excited into localized states in the band tails and by carriers of the delocalized states in the valence band.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:inglés
Publicado: 2017
Subjects:
Acceso en liña:https://doi.org/10.1007/s11182-017-0925-x
Formato: MixedMaterials Electrónico Capítulo de libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=656062

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200 1 |a Electrophysical Properties of Ge–Sb–Te Thin Films for Phase Change Memory Devices  |f P. I. Lazarenko [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: p. 1423-1424 (25 tit.)] 
330 |a In this work, we studied temperature dependences of the resistivity and current-voltage characteristics of amorphous thin films based on the materials of a Ge-Sb-Te system of compositions GeSb4Te7 (GST147), GeSb2Te4 (GST124), and Ge2Sb2Te5 (GST225) applied in the phase change memory devices. The effect of changes in the composition of thin films on the crystallization temperature, resistivity of films in amorphous and crystalline states, and on the activation energy of conductivity is determined. It is found that the peculiarity of these materials is the mechanism of two-channel conductivity where the contribution to the conductivity is made by charge carriers excited into localized states in the band tails and by carriers of the delocalized states in the valence band. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Russian Physics Journal 
463 |t Vol. 59, iss. 9  |v [P. 1417-1424]  |d 2017 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a phase change memory 
610 1 |a temperature dependences of the resistivity 
610 1 |a current-voltage characteristics 
610 1 |a energy diagram 
610 1 |a GST147 
610 1 |a GST124 
610 1 |a GST225 
610 1 |a температурные зависимости 
610 1 |a удельное сопротивление 
610 1 |a энергетические диаграммы 
610 1 |a вольт-амперные характеристики 
610 1 |a изменения 
610 1 |a фазы 
701 1 |a Lazarenko  |b P. I.  |g Petr Ivanovich 
701 1 |a Kozyukhin  |b S. A.  |g Sergey Aleksandrovich 
701 1 |a Sherchenkov  |b A. A.  |g Aleksey Anatoljevich 
701 1 |a Babich  |b A. V.  |g Aleksey Valterovich 
701 1 |a Timoshenkov  |b S. P.  |g Sergey Petrovich 
701 1 |a Gromov  |b D. G.  |g Dmitry Gennadjevich 
701 1 |a Zabolotskaya  |b A. V.  |g Anastasiya Vladimirovna 
701 1 |a Kozik  |b V. V.  |c Chemical Engineer  |c Professor-consultant of Yurga technological Institute of Tomsk Polytechnic University  |f 1947-  |g Vladimir Vasilievich  |3 (RuTPU)RU\TPU\pers\34722  |9 18072 
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