Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire
| Parent link: | Journal of Optics Vol. 18, iss. 6.— 2016.— [064007, 10 p.] |
|---|---|
| Awdur Corfforaethol: | |
| Awduron Eraill: | , , , , , , , , , , , , , , |
| Crynodeb: | Title screen Three-dimensional (3D) Bragg coherent x-ray diffractive imaging (CXDI) with a nanofocused beam was applied to quantitatively map the internal strain field of a single indium phosphide nanowire. The quantitative values of the strain were obtained by pre-characterization of the beam profile with transmission ptychography on a test sample. Our measurements revealed the 3D strain distribution in a region of 150 nm below the catalyst Au particle. We observed a slight gradient of the strain in the range of ±0.6% along the [111] growth direction of the nanowire. We also determined the spatial resolution in our measurements to be about 10 nm in the direction perpendicular to the facets of the nanowire. The CXDI measurements were compared with the finite element method simulations and show a good agreement with our experimental results. The proposed approach can become an effective tool for in operando studies of the nanowires. |
| Cyhoeddwyd: |
2016
|
| Pynciau: | |
| Mynediad Ar-lein: | https://doi.org/10.1088/2040-8978/18/6/064007 |
| Fformat: | Electronig Pennod Llyfr |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=656017 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 656017 | ||
| 005 | 20250401152158.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\22362 | ||
| 090 | |a 656017 | ||
| 100 | |a 20171018d2016 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a GB | ||
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire |f D. Dzhigaev [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: 41 tit.] | ||
| 330 | |a Three-dimensional (3D) Bragg coherent x-ray diffractive imaging (CXDI) with a nanofocused beam was applied to quantitatively map the internal strain field of a single indium phosphide nanowire. The quantitative values of the strain were obtained by pre-characterization of the beam profile with transmission ptychography on a test sample. Our measurements revealed the 3D strain distribution in a region of 150 nm below the catalyst Au particle. We observed a slight gradient of the strain in the range of ±0.6% along the [111] growth direction of the nanowire. We also determined the spatial resolution in our measurements to be about 10 nm in the direction perpendicular to the facets of the nanowire. The CXDI measurements were compared with the finite element method simulations and show a good agreement with our experimental results. The proposed approach can become an effective tool for in operando studies of the nanowires. | ||
| 461 | |t Journal of Optics | ||
| 463 | |t Vol. 18, iss. 6 |v [064007, 10 p.] |d 2016 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a X-Ray | |
| 610 | 1 | |a нанопроволоки | |
| 701 | 1 | |a Dzhigaev |b D. |g Dmitry | |
| 701 | 1 | |a Shabalin |b A. |g Anatoly | |
| 701 | 1 | |a Stankevic |b T. |g Tomas | |
| 701 | 1 | |a Lorenz |b U. |g Ulf | |
| 701 | 1 | |a Kurta |b R. P. |g Ruslan | |
| 701 | 1 | |a Seiboth |b F. |g Frank | |
| 701 | 1 | |a Wallentin |b J. |g Jesper | |
| 701 | 1 | |a Singer |b A. |g Andrej | |
| 701 | 1 | |a Lazarev |b S. V. |c physicist |c engineer at Tomsk Polytechnic University |f 1984- |g Sergey Vladimirovich |3 (RuTPU)RU\TPU\pers\35210 | |
| 701 | 1 | |a Yefanov |b O. M. |g Oleksandr | |
| 701 | 1 | |a Borgstrom |b M. T. |g Magnus | |
| 701 | 1 | |a Strikhanov |b M. N. |g Mikhail Nikolaevich | |
| 701 | 1 | |a Samuelson |b L. |g Lars | |
| 701 | 1 | |a Falkenberg |b G. |g Gerald | |
| 701 | 1 | |a Schroer |b Ch. G. |g Christian | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Институт физики высоких технологий (ИФВТ) |b Кафедра высоковольтной электрофизики и сильноточной электроники (ВЭСЭ) |3 (RuTPU)RU\TPU\col\22618 |
| 801 | 2 | |a RU |b 63413507 |c 20171018 |g RCR | |
| 856 | 4 | |u https://doi.org/10.1088/2040-8978/18/6/064007 | |
| 942 | |c CF | ||