$Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire$

Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire

Bibliographic Details
Parent link:	Journal of Optics Vol. 18, iss. 6.— 2016.— [064007, 10 p.]
Corporate Author:	Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Кафедра высоковольтной электрофизики и сильноточной электроники (ВЭСЭ)
Other Authors:	Dzhigaev D. Dmitry, Shabalin A. Anatoly, Stankevic T. Tomas, Lorenz U. Ulf, Kurta R. P. Ruslan, Seiboth F. Frank, Wallentin J. Jesper, Singer A. Andrej, Lazarev S. V. Sergey Vladimirovich, Yefanov O. M. Oleksandr, Borgstrom M. T. Magnus, Strikhanov M. N. Mikhail Nikolaevich, Samuelson L. Lars, Falkenberg G. Gerald, Schroer Ch. G. Christian
Summary:	Title screen Three-dimensional (3D) Bragg coherent x-ray diffractive imaging (CXDI) with a nanofocused beam was applied to quantitatively map the internal strain field of a single indium phosphide nanowire. The quantitative values of the strain were obtained by pre-characterization of the beam profile with transmission ptychography on a test sample. Our measurements revealed the 3D strain distribution in a region of 150 nm below the catalyst Au particle. We observed a slight gradient of the strain in the range of ±0.6% along the [111] growth direction of the nanowire. We also determined the spatial resolution in our measurements to be about 10 nm in the direction perpendicular to the facets of the nanowire. The CXDI measurements were compared with the finite element method simulations and show a good agreement with our experimental results. The proposed approach can become an effective tool for in operando studies of the nanowires.
Published:	2016
Subjects:	электронный ресурс труды учёных ТПУ X-Ray нанопроволоки
Online Access:	https://doi.org/10.1088/2040-8978/18/6/064007
Format:	Electronic Book Chapter
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=656017

Description
Summary:	Title screen Three-dimensional (3D) Bragg coherent x-ray diffractive imaging (CXDI) with a nanofocused beam was applied to quantitatively map the internal strain field of a single indium phosphide nanowire. The quantitative values of the strain were obtained by pre-characterization of the beam profile with transmission ptychography on a test sample. Our measurements revealed the 3D strain distribution in a region of 150 nm below the catalyst Au particle. We observed a slight gradient of the strain in the range of ±0.6% along the [111] growth direction of the nanowire. We also determined the spatial resolution in our measurements to be about 10 nm in the direction perpendicular to the facets of the nanowire. The CXDI measurements were compared with the finite element method simulations and show a good agreement with our experimental results. The proposed approach can become an effective tool for in operando studies of the nanowires.
DOI:	10.1088/2040-8978/18/6/064007