Measurement of free surface energy of laser treated aluminum substrate

Manylion Llyfryddiaeth
Parent link:MATEC Web of Conferences
Vol. 110 : Heat and Mass Transfer in the Thermal Control System of Technical and Technological Energy Equipment (HMTTSC 2017).— 2017.— [01026, 5 p.]
Awduron Corfforaethol: Национальный исследовательский Томский политехнический университет (ТПУ) Энергетический институт (ЭНИН) Кафедра теоретической и промышленной теплотехники (ТПТ), Национальный исследовательский Томский политехнический университет (ТПУ) Энергетический институт (ЭНИН) Кафедра электроснабжения промышленных предприятий (ЭПП)
Awduron Eraill: Batishcheva K. A. Kseniya Arturovna, Feoktistov D. V. Dmitriy Vladimirovich, Islamova A. G. Anastasiya Gomilievna, Shanenkov I. I. Ivan Igorevich
Crynodeb:Title screen
The change in the surface energy of the aluminum substrate after laser treatment has been determined experimentally. Surface energy is determined using the Advance KRUSS software. The laser treatment of the surface is found to increase its free surface energy. It changes the ratio of the polar and the dispersion components. Analysis of the crystalline planes of aluminum surface after laser treatment was provided by XRD X-ray diffractometry using a Shimadzu XRD 7000S diffractometer.
Iaith:Saesneg
Cyhoeddwyd: 2017
Pynciau:
Mynediad Ar-lein:https://doi.org/10.1051/matecconf/201711001026
http://earchive.tpu.ru/handle/11683/42594
Fformat: Electronig Pennod Llyfr
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=655328
Disgrifiad
Crynodeb:Title screen
The change in the surface energy of the aluminum substrate after laser treatment has been determined experimentally. Surface energy is determined using the Advance KRUSS software. The laser treatment of the surface is found to increase its free surface energy. It changes the ratio of the polar and the dispersion components. Analysis of the crystalline planes of aluminum surface after laser treatment was provided by XRD X-ray diffractometry using a Shimadzu XRD 7000S diffractometer.
DOI:10.1051/matecconf/201711001026