PiC code KARAT simulations of Coherent THz Smith-Purcell Radiation from diffraction gratings of various profiles; Journal of Physics: Conference Series; Vol. 830 : Energy Fluxes and Radiation Effects 2016

Xehetasun bibliografikoak
Parent link:Journal of Physics: Conference Series
Vol. 830 : Energy Fluxes and Radiation Effects 2016.— 2017.— [012147, 5 p.]
Egile korporatiboa: Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Кафедра высоковольтной электрофизики и сильноточной электроники (ВЭСЭ), Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
Beste egile batzuk: Artyomov K. P. Konstantin Petrovich, Ryzhov V. V. Viktor Vasilievich, Potylitsyn A. P. Alexander Petrovich, Sukhikh L. G. Leonid Grigorievich
Gaia:Title screen
Generation of coherent THz Smith-Purcell radiation by single electron bunch or multi-bunched electron beam was simulated for lamellar, sinusoidal and echelette gratings. The dependences of the CSPR intensity of the corrugation gratings depth were investigated. The angular and spectral characteristics of the CSPR for different profiles of diffraction gratings were obtained. It is shown that in the case of femtosecond multi-bunched electron beam with 10 MeV energy sinusoidal grating with period 292 [mu]m and groove depth 60 [mu]m has the uniform angular distribution with high radiation intensity.
Hizkuntza:ingelesa
Argitaratua: 2017
Saila:Radiation physics and chemistry of condensed matter
Gaiak:
Sarrera elektronikoa:http://dx.doi.org/10.1088/1742-6596/830/1/012147
http://earchive.tpu.ru/handle/11683/39513
Formatua: Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=654960
Deskribapena
Gaia:Title screen
Generation of coherent THz Smith-Purcell radiation by single electron bunch or multi-bunched electron beam was simulated for lamellar, sinusoidal and echelette gratings. The dependences of the CSPR intensity of the corrugation gratings depth were investigated. The angular and spectral characteristics of the CSPR for different profiles of diffraction gratings were obtained. It is shown that in the case of femtosecond multi-bunched electron beam with 10 MeV energy sinusoidal grating with period 292 [mu]m and groove depth 60 [mu]m has the uniform angular distribution with high radiation intensity.
DOI:10.1088/1742-6596/830/1/012147