Calculation of Optimal Geometrical Magnification and Spatial Resolution of Betatron Tomograph; IOP Conference Series: Materials Science and Engineering; Vol. 189 : Modern Technologies for Non-Destructive Testing
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 189 : Modern Technologies for Non-Destructive Testing.— 2017.— [012022, 5 p.] |
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| Hlavní autor: | |
| Korporativní autor: | |
| Další autoři: | , |
| Shrnutí: | Title screen One of the perspective directions of development of non-destructive testing is the method of computed tomography. Computed tomography really enhances the ability of X-ray inspection, from thin and simple to thick and complex parts. There are many factors that influence the performance of computed tomography, the main parameters for computed tomography scanners and also scanner based on betatron, are geometric magnification and spatial resolution. Calculations of these parameters for the betatron tomograph are shown in this paper. |
| Jazyk: | angličtina |
| Vydáno: |
2017
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| Témata: | |
| On-line přístup: | http://dx.doi.org/10.1088/1757-899X/189/1/012022 http://earchive.tpu.ru/handle/11683/38509 |
| Médium: | Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=654817 |
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| 200 | 1 | |a Calculation of Optimal Geometrical Magnification and Spatial Resolution of Betatron Tomograph |f Y. Zhong, S. V. Chakhlov, V. B. Trinh | |
| 203 | |a Text |c electronic | ||
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| 330 | |a One of the perspective directions of development of non-destructive testing is the method of computed tomography. Computed tomography really enhances the ability of X-ray inspection, from thin and simple to thick and complex parts. There are many factors that influence the performance of computed tomography, the main parameters for computed tomography scanners and also scanner based on betatron, are geometric magnification and spatial resolution. Calculations of these parameters for the betatron tomograph are shown in this paper. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\2008 |t IOP Conference Series: Materials Science and Engineering | |
| 463 | 0 | |0 (RuTPU)RU\TPU\network\20484 |t Vol. 189 : Modern Technologies for Non-Destructive Testing |o 5th International Conference, 3–8 October 2016, Tomsk, Russian Federation |o [proceedings] |v [012022, 5 p.] |d 2017 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a увеличение | |
| 610 | 1 | |a пространственное разрешение | |
| 610 | 1 | |a бетатроны | |
| 610 | 1 | |a томографы | |
| 610 | 1 | |a неразрушающий контроль | |
| 610 | 1 | |a компьютерная томография | |
| 700 | 1 | |a Zhong |b Y. | |
| 701 | 1 | |a Chakhlov |b S. V. |c physicist |c Head of the laboratory of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1956- |g Sergey Vladimirovich |3 (RuTPU)RU\TPU\pers\34254 |9 17785 | |
| 701 | 1 | |a Trinh |b V. B. | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Институт неразрушающего контроля (ИНК) |b Российско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД) |3 (RuTPU)RU\TPU\col\21551 |
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