Automation of testing modules of controller ELSY-ТМК
| Parent link: | Journal of Physics: Conference Series Vol. 803 : Information Technologies in Business and Industry (ITBI2016).— 2017.— [012034, 4 p.] |
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| مؤلف مشترك: | |
| مؤلفون آخرون: | , , , |
| الملخص: | Title screen In modern life, there are means for automation of various processes which allow one to provide high quality standards of released products and to raise labour efficiency. In the given paper, the data on the automation of the test process of the ELSY-TMK controller [1] is presented. The ELSY-TMK programmed logic controller is an effective modular platform for construction of automation systems for small and average branches of industrial production. The modern and functional standard of communication and open environment of the logic controller give a powerful tool of wide spectrum applications for industrial automation. The algorithm allows one to test controller modules by operating the switching system and external devices faster and at a higher level of quality than a human without such means does. |
| اللغة: | الإنجليزية |
| منشور في: |
2017
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://dx.doi.org/10.1088/1742-6596/803/1/012034 http://earchive.tpu.ru/handle/11683/38139 |
| التنسيق: | الكتروني فصل الكتاب |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=654318 |
| الملخص: | Title screen In modern life, there are means for automation of various processes which allow one to provide high quality standards of released products and to raise labour efficiency. In the given paper, the data on the automation of the test process of the ELSY-TMK controller [1] is presented. The ELSY-TMK programmed logic controller is an effective modular platform for construction of automation systems for small and average branches of industrial production. The modern and functional standard of communication and open environment of the logic controller give a powerful tool of wide spectrum applications for industrial automation. The algorithm allows one to test controller modules by operating the switching system and external devices faster and at a higher level of quality than a human without such means does. |
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| DOI: | 10.1088/1742-6596/803/1/012034 |