Energy spectrum analysis for intense pulsed electron beam; Laser and Particle Beams; Vol. 34, iss. 4

Detaylı Bibliyografya
Parent link:Laser and Particle Beams
Vol. 34, iss. 4.— 2016.— [P. 742-747]
Müşterek Yazar: Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Лаборатория № 1
Diğer Yazarlar: Shen J. Jie, An H. H., Liu H. Y., Remnev G. E. Gennady Efimovich, Nashilevskiy A. V. Aleksandr Vladimirovich, Li D. Y. Dongyu, Zhang J., Zhong H. W. Haowen, Cui X. J. Xiaojun, Liang G. Y. Guoying, Qu M. Miao, Yan Sh. Sha, Zhang X. Xiaofu, Zhang G. Gaolong, Yu X. Xiao
Özet:Title screen
As the energy spread of intense pulsed electron beams (IPEB) strongly influences the irradiation effects, it has been of great importance to characterize the IPEB energy spectrum. With the combination of Child–Langmuir law and Monte Carlo simulation, the IPEB energy spectrum has been obtained in this work by transformation from the accelerating voltage applied to the diode. To verify the accuracy of this simple algorithm, a magnetic spectrometer with an imaging plate was designed to test the IPEB energy spectrum. The measurement was completed with IPEB generated by explosive emission electron diode, the pulse duration, maximum electron energy, total beam current being 80 ns, 450 keV, and 1 kA, respectively. The results verified the reliability of the above analysis method for energy spectrum, which can avoid intercepting the beam, and at the same time significantly improved the energy resolution. Some calculation and experimental details are discussed in this paper.
Dil:İngilizce
Baskı/Yayın Bilgisi: 2016
Konular:
Online Erişim:https://doi.org/10.1017/S0263034616000707
Materyal Türü: MixedMaterials Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=654297

MARC

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200 1 |a Energy spectrum analysis for intense pulsed electron beam  |f J. Shen [et al.] 
203 |a Text  |c electronic 
300 |a Title screen 
320 |a [References: p. 747 (20 tit.)] 
330 |a As the energy spread of intense pulsed electron beams (IPEB) strongly influences the irradiation effects, it has been of great importance to characterize the IPEB energy spectrum. With the combination of Child–Langmuir law and Monte Carlo simulation, the IPEB energy spectrum has been obtained in this work by transformation from the accelerating voltage applied to the diode. To verify the accuracy of this simple algorithm, a magnetic spectrometer with an imaging plate was designed to test the IPEB energy spectrum. The measurement was completed with IPEB generated by explosive emission electron diode, the pulse duration, maximum electron energy, total beam current being 80 ns, 450 keV, and 1 kA, respectively. The results verified the reliability of the above analysis method for energy spectrum, which can avoid intercepting the beam, and at the same time significantly improved the energy resolution. Some calculation and experimental details are discussed in this paper. 
461 |t Laser and Particle Beams 
463 |t Vol. 34, iss. 4  |v [P. 742-747]  |d 2016 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a импульсные электронные пучки 
610 1 |a энергетические спектры 
610 1 |a метод Монте-Карло 
610 1 |a моделирование 
610 1 |a магнитные спектрометры 
610 1 |a пластинчатые отражатели 
610 1 |a intense pulsed electron beam 
610 1 |a energy spectrum 
610 1 |a Monte Carlo simulation 
610 1 |a magnetic spectrometer 
610 1 |a imaging plate 
701 1 |a Shen  |b J.  |g Jie 
701 1 |a An  |b H. H. 
701 1 |a Liu  |b H. Y. 
701 1 |a Remnev  |b G. E.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1948-  |g Gennady Efimovich  |3 (RuTPU)RU\TPU\pers\31500 
701 1 |a Nashilevskiy  |b A. V.  |c specialist in the field of electrical engineering  |c Associate Scientist of Tomsk Polytechnic University, engineer  |f 1985-  |g Aleksandr Vladimirovich  |3 (RuTPU)RU\TPU\pers\34507 
701 1 |a Li  |b D. Y.  |g Dongyu 
701 1 |a Zhang  |b J. 
701 1 |a Zhong  |b H. W.  |g Haowen 
701 1 |a Cui  |b X. J.  |g Xiaojun 
701 1 |a Liang  |b G. Y.  |g Guoying 
701 1 |a Qu  |b M.  |g Miao 
701 1 |a Yan  |b Sh.  |g Sha 
701 1 |a Zhang  |b X.  |g Xiaofu 
701 1 |a Zhang  |b G.  |g Gaolong 
701 1 |a Yu  |b X.  |g Xiao 
712 0 2 |a Национальный исследовательский Томский политехнический университет (ТПУ)  |b Институт физики высоких технологий (ИФВТ)  |b Лаборатория № 1  |3 (RuTPU)RU\TPU\col\19035 
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