Energy spectrum analysis for intense pulsed electron beam; Laser and Particle Beams; Vol. 34, iss. 4
| Parent link: | Laser and Particle Beams Vol. 34, iss. 4.— 2016.— [P. 742-747] |
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| Müşterek Yazar: | |
| Diğer Yazarlar: | , , , , , , , , , , , , , , |
| Özet: | Title screen As the energy spread of intense pulsed electron beams (IPEB) strongly influences the irradiation effects, it has been of great importance to characterize the IPEB energy spectrum. With the combination of Child–Langmuir law and Monte Carlo simulation, the IPEB energy spectrum has been obtained in this work by transformation from the accelerating voltage applied to the diode. To verify the accuracy of this simple algorithm, a magnetic spectrometer with an imaging plate was designed to test the IPEB energy spectrum. The measurement was completed with IPEB generated by explosive emission electron diode, the pulse duration, maximum electron energy, total beam current being 80 ns, 450 keV, and 1 kA, respectively. The results verified the reliability of the above analysis method for energy spectrum, which can avoid intercepting the beam, and at the same time significantly improved the energy resolution. Some calculation and experimental details are discussed in this paper. |
| Dil: | İngilizce |
| Baskı/Yayın Bilgisi: |
2016
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| Konular: | |
| Online Erişim: | https://doi.org/10.1017/S0263034616000707 |
| Materyal Türü: | MixedMaterials Elektronik Kitap Bölümü |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=654297 |
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| 200 | 1 | |a Energy spectrum analysis for intense pulsed electron beam |f J. Shen [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 747 (20 tit.)] | ||
| 330 | |a As the energy spread of intense pulsed electron beams (IPEB) strongly influences the irradiation effects, it has been of great importance to characterize the IPEB energy spectrum. With the combination of Child–Langmuir law and Monte Carlo simulation, the IPEB energy spectrum has been obtained in this work by transformation from the accelerating voltage applied to the diode. To verify the accuracy of this simple algorithm, a magnetic spectrometer with an imaging plate was designed to test the IPEB energy spectrum. The measurement was completed with IPEB generated by explosive emission electron diode, the pulse duration, maximum electron energy, total beam current being 80 ns, 450 keV, and 1 kA, respectively. The results verified the reliability of the above analysis method for energy spectrum, which can avoid intercepting the beam, and at the same time significantly improved the energy resolution. Some calculation and experimental details are discussed in this paper. | ||
| 461 | |t Laser and Particle Beams | ||
| 463 | |t Vol. 34, iss. 4 |v [P. 742-747] |d 2016 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a импульсные электронные пучки | |
| 610 | 1 | |a энергетические спектры | |
| 610 | 1 | |a метод Монте-Карло | |
| 610 | 1 | |a моделирование | |
| 610 | 1 | |a магнитные спектрометры | |
| 610 | 1 | |a пластинчатые отражатели | |
| 610 | 1 | |a intense pulsed electron beam | |
| 610 | 1 | |a energy spectrum | |
| 610 | 1 | |a Monte Carlo simulation | |
| 610 | 1 | |a magnetic spectrometer | |
| 610 | 1 | |a imaging plate | |
| 701 | 1 | |a Shen |b J. |g Jie | |
| 701 | 1 | |a An |b H. H. | |
| 701 | 1 | |a Liu |b H. Y. | |
| 701 | 1 | |a Remnev |b G. E. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1948- |g Gennady Efimovich |3 (RuTPU)RU\TPU\pers\31500 | |
| 701 | 1 | |a Nashilevskiy |b A. V. |c specialist in the field of electrical engineering |c Associate Scientist of Tomsk Polytechnic University, engineer |f 1985- |g Aleksandr Vladimirovich |3 (RuTPU)RU\TPU\pers\34507 | |
| 701 | 1 | |a Li |b D. Y. |g Dongyu | |
| 701 | 1 | |a Zhang |b J. | |
| 701 | 1 | |a Zhong |b H. W. |g Haowen | |
| 701 | 1 | |a Cui |b X. J. |g Xiaojun | |
| 701 | 1 | |a Liang |b G. Y. |g Guoying | |
| 701 | 1 | |a Qu |b M. |g Miao | |
| 701 | 1 | |a Yan |b Sh. |g Sha | |
| 701 | 1 | |a Zhang |b X. |g Xiaofu | |
| 701 | 1 | |a Zhang |b G. |g Gaolong | |
| 701 | 1 | |a Yu |b X. |g Xiao | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Институт физики высоких технологий (ИФВТ) |b Лаборатория № 1 |3 (RuTPU)RU\TPU\col\19035 |
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| 856 | 4 | |u https://doi.org/10.1017/S0263034616000707 | |
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