Optimizing components and evaluating technical performance of IR thermographic NDT systems; Proceedings of SPIE; Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII
| Parent link: | Proceedings of SPIE Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII.— 2016.— [98610M] |
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| Prif Awdur: | |
| Awdur Corfforaethol: | |
| Awduron Eraill: | , |
| Crynodeb: | Title screen A typical infrared (IR) thermographic system intended for active thermal/IR nondestructive testing includes a heat source, an IR imager and a computer. The software ensures acquisition and processing of IR image sequences to result in a binary map of defects or other image which is to be interpreted by a thermographer in order to meet inspection requirements. Typically, hardware developers supply a certain set of technical parameters of their units, such as heater power, imager temperature resolution, acquisition rate and a set of available data processing algorithms. The suggested approach allows optimization of inspection parameters if thermal and optical parameters of test materials are known. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. Режим доступа: по договору с организацией-держателем ресурса |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
2016
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| Cyfres: | Nondestructive Testing and Composites |
| Pynciau: | |
| Mynediad Ar-lein: | http://dx.doi.org/10.1117/12.2222981 |
| Fformat: | Electronig Pennod Llyfr |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=654083 |
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| 200 | 1 | |a Optimizing components and evaluating technical performance of IR thermographic NDT systems |f A. O. Chulkov, V. P. Vavilov, S. S. Pawar | |
| 203 | |a Text |c electronic | ||
| 225 | 1 | |a Nondestructive Testing and Composites | |
| 300 | |a Title screen | ||
| 320 | |a [References: 11 tit.] | ||
| 330 | |a A typical infrared (IR) thermographic system intended for active thermal/IR nondestructive testing includes a heat source, an IR imager and a computer. The software ensures acquisition and processing of IR image sequences to result in a binary map of defects or other image which is to be interpreted by a thermographer in order to meet inspection requirements. Typically, hardware developers supply a certain set of technical parameters of their units, such as heater power, imager temperature resolution, acquisition rate and a set of available data processing algorithms. The suggested approach allows optimization of inspection parameters if thermal and optical parameters of test materials are known. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\14324 |t Proceedings of SPIE | |
| 463 | 0 | |0 (RuTPU)RU\TPU\network\14326 |t Vol. 9861 : Thermosense: Thermal Infrared Applications XXXVIII |o Baltimore, Maryland, United States, April 17, 2016 |o [proceedings] |v [98610M] |d 2016 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a инфракрасное излучение | |
| 610 | 1 | |a неразрушающий контроль | |
| 610 | 1 | |a обработка данных | |
| 610 | 1 | |a алгоритмы | |
| 700 | 1 | |a Chulkov |b A. O. |c specialist in the field of non-destructive testing |c Deputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences |f 1989- |g Arseniy Olegovich |3 (RuTPU)RU\TPU\pers\32220 |9 16220 | |
| 701 | 1 | |a Vavilov |b V. P. |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT) |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) |f 1949- |g Vladimir Platonovich |3 (RuTPU)RU\TPU\pers\32161 |9 16163 | |
| 701 | 1 | |a Pawar |b S. S. |c specialist in the field of non-destructive testing |c Associate Scientist of Tomsk Polytechnic University |f 1980- |g Sachin Sampatrao |3 (RuTPU)RU\TPU\pers\35940 | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Институт неразрушающего контроля (ИНК) |b Лаборатория № 34 (Тепловых методов контроля) |3 (RuTPU)RU\TPU\col\19616 |
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| 856 | 4 | |u http://dx.doi.org/10.1117/12.2222981 | |
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