Birefringent coherent diffraction imaging; Proceedings of SPIE; Vol. 9931 : Spintronics IX

Bibliografiske detaljer
Parent link:Proceedings of SPIE
Vol. 9931 : Spintronics IX.— 2016.— [99312F, 16 p.]
Institution som forfatter: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра общей физики (ОФ)
Andre forfattere: Karpov D. A. Dmitriy Andreevich, Rolo T. S. Tomy Santos, Hannah R. Rich, Kryuchkov Yu.Yu. Yuri Yurievich, Kiefer B. Boris, Fohtung E.
Summary:Title screen
Directional dependence of the index of refraction contains a wealth of information about anisotropic optical properties in semiconducting and insulating materials. Here we present a novel high-resolution lens-less technique that uses birefringence as a contrast mechanism to map the index of refraction and dielectric permittivity in optically anisotropic materials. We applied this approach successfully to a liquid crystal polymer film using polarized light from helium neon laser. This approach is scalable to imaging with diffraction-limited resolution, a prospect rapidly becoming a reality in view of emergent brilliant X-ray sources. Applications of this novel imaging technique are in disruptive technologies, including novel electronic devices, in which both charge and spin carry information as in multiferroic materials and photonic materials such as light modulators and optical storage. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Режим доступа: по договору с организацией-держателем ресурса
Sprog:engelsk
Udgivet: 2016
Serier:Spin-orbit Coupling
Fag:
Online adgang:http://dx.doi.org/10.1117/12.2235865
Format: MixedMaterials Electronisk Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=653914

MARC

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330 |a Directional dependence of the index of refraction contains a wealth of information about anisotropic optical properties in semiconducting and insulating materials. Here we present a novel high-resolution lens-less technique that uses birefringence as a contrast mechanism to map the index of refraction and dielectric permittivity in optically anisotropic materials. We applied this approach successfully to a liquid crystal polymer film using polarized light from helium neon laser. This approach is scalable to imaging with diffraction-limited resolution, a prospect rapidly becoming a reality in view of emergent brilliant X-ray sources. Applications of this novel imaging technique are in disruptive technologies, including novel electronic devices, in which both charge and spin carry information as in multiferroic materials and photonic materials such as light modulators and optical storage. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only. 
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