The Mathematical Model of Image, Generated by Scanning Digital Radiography System; IOP Conference Series: Materials Science and Engineering; Vol. 168 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2016)
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 168 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2016).— 2017.— [012042, 6 p.] |
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| Autor principal: | |
| Autor corporatiu: | |
| Altres autors: | , |
| Sumari: | Title screen The mathematical model of image, generated by scanning digital radiography system is present. This model takes into account the X-ray energy spectrum transformation of the test object and a noise due to the quantum nature of radiation. The calculation results confirm the importance of fluctuations of the absorbed energy of the registered photon for the small size of the scintillation detectors. |
| Idioma: | anglès |
| Publicat: |
2017
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| Col·lecció: | Physical and chemical phenomena in inorganic materials in radiation, electrical and thermal fields |
| Matèries: | |
| Accés en línia: | http://dx.doi.org/10.1088/1757-899X/168/1/012042 http://earchive.tpu.ru/handle/11683/37756 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=653815 |
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| 200 | 1 | |a The Mathematical Model of Image, Generated by Scanning Digital Radiography System |f V. A. Udod, S. P. Osipov, Wang Yanzhao | |
| 203 | |a Text |c electronic | ||
| 225 | 1 | |a Physical and chemical phenomena in inorganic materials in radiation, electrical and thermal fields | |
| 300 | |a Title screen | ||
| 320 | |a [References: 8 tit.] | ||
| 330 | |a The mathematical model of image, generated by scanning digital radiography system is present. This model takes into account the X-ray energy spectrum transformation of the test object and a noise due to the quantum nature of radiation. The calculation results confirm the importance of fluctuations of the absorbed energy of the registered photon for the small size of the scintillation detectors. | ||
| 461 | 0 | |0 (RuTPU)RU\TPU\network\2008 |t IOP Conference Series: Materials Science and Engineering | |
| 463 | 0 | |0 (RuTPU)RU\TPU\network\19289 |t Vol. 168 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2016) |o XII International Conference, 4–12 September 2016, Tomsk, Russian Federation |o [proceedings] |v [012042, 6 p.] |d 2017 | |
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a математические модели | |
| 610 | 1 | |a изображения | |
| 610 | 1 | |a сканирующие системы | |
| 610 | 1 | |a цифровые системы | |
| 610 | 1 | |a детекторы | |
| 610 | 1 | |a сцинтилляционные детекторы | |
| 610 | 1 | |a рентгеновские излучения | |
| 700 | 1 | |a Udod |b V. A. |c specialist in the field of non-destructive testing |c Leading researcher of Tomsk Polytechnic University, Doctor of technical sciences |f 1959- |g Viktor Anatolievich |3 (RuTPU)RU\TPU\pers\35232 | |
| 701 | 1 | |a Osipov |b S. P. |c specialist in the field of non-destructive testing |c Leading researcher of Tomsk Polytechnic University, candidate of technical sciences |f 1958- |g Sergey Pavlovich |3 (RuTPU)RU\TPU\pers\35098 |9 18373 | |
| 701 | 0 | |a Wang Yanzhao |c specialist in the field of non-destructive testing |c Associate Scientistof Tomsk Polytechnic University |f 1991- |3 (RuTPU)RU\TPU\pers\39799 | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Институт неразрушающего контроля (ИНК) |b Российско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД) |3 (RuTPU)RU\TPU\col\21551 |
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