Simulation of the microtron electron beam profile formation using flattening filters

Simulation of the microtron electron beam profile formation using flattening filters

Bibliographic Details
Parent link:Physics of Particles and Nuclei Letters: Scientific Journal
Vol. 13, iss. 7.— 2016.— [P. 890–892]
Corporate Authors: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ), Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ) Инновационная международная научно-образовательная лаборатория "Фотон" (ИМНОЛ "Фотон")
Other Authors: Miloichikova I. A. Irina Alekseevna, Stuchebrov S. G. Sergey Gennadevich, Danilova I. B. Irina Borisovna, Naumenko G. A. Gennadiy Andreevich
Summary:Title screen
The development of new modern methods of electron beam profile forming becomes an important problem with the expansion of the application spectrum of electrons, both in industry and in medicine. This paper presents the results of a numerical simulation of the electron beam profile formed by flattening filters of different materials (aluminum and ABS-plastic). The model corresponding to the actual beam was developed based on the experimental estimation of shape and profile of the extracted microtron electron beam. Next, the geometry of flattening filters made of aluminum and ABS-plastic was calculated, and the electron beam profile was theoretically analyzed.
Режим доступа: по договору с организацией-держателем ресурса
Language:English
Published: 2016
Series:Physics and Technique of Accelerators
Subjects:
электронный ресурс
труды учёных ТПУ
электронные пучки
моделирование
Online Access:http://dx.doi.org/10.1134/S1547477116070384
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=653245

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