Basic metrological properties of electronic oscillators with direct digital synthesis; Measurement; Vol. 98

書誌詳細
Parent link:Measurement
Vol. 98.— 2017.— [P. 243-249]
第一著者: Rybin Yu. K. Yuriy Konstantinovich
団体著者: Национальный исследовательский Томский политехнический университет (ТПУ) Институт кибернетики (ИК)
その他の著者: Petlina T. A. Tatjyana Andreevna
要約:Title screen
Signal oscillators based on DDS (Direct Digital Synthesis) are widely used in recent years. However, order metrological characteristics of signals generated by these oscillators have not been studied in many cases, and uses of such oscillators are not always justified. First of all, signals of the most popular sine waveform are unsatisfactory in terms of metrology, including errors of amplitude, period and their instability, total harmonic distortion. Certainly, with the development of integrated circuit fabrication technology, errors of basic units decrease. Therefore, it can be expected that instrumental errors will be decreasing in the nearest future. However, not only instrumental but also method errors are intrinsic to direct digital synthesis of signals. These method errors will determine limiting metrological characteristics as a hardware component of digital oscillators continue to be improved.
Режим доступа: по договору с организацией-держателем ресурса
言語:英語
出版事項: 2017
主題:
オンライン・アクセス:http://dx.doi.org/10.1016/j.measurement.2016.12.009
フォーマット: 電子媒体 図書の章
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652967

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330 |a Signal oscillators based on DDS (Direct Digital Synthesis) are widely used in recent years. However, order metrological characteristics of signals generated by these oscillators have not been studied in many cases, and uses of such oscillators are not always justified. First of all, signals of the most popular sine waveform are unsatisfactory in terms of metrology, including errors of amplitude, period and their instability, total harmonic distortion. Certainly, with the development of integrated circuit fabrication technology, errors of basic units decrease. Therefore, it can be expected that instrumental errors will be decreasing in the nearest future. However, not only instrumental but also method errors are intrinsic to direct digital synthesis of signals. These method errors will determine limiting metrological characteristics as a hardware component of digital oscillators continue to be improved. 
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