Analyzing the thermal regime of power supply units in portable betatrons by using infrared thermography; MATEC Web of Conferences; Vol. 92 : Thermophysical Basis of Energy Technologies (TBET-2016)
| Parent link: | MATEC Web of Conferences Vol. 92 : Thermophysical Basis of Energy Technologies (TBET-2016).— 2017.— [01017, 4 p.] |
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| Collectivités auteurs: | , |
| Autres auteurs: | , , , |
| Résumé: | Title screen Potentials of infrared thermography in analyzing a thermal regime of the 7.5 MeV betatron power supply are discussed. Both the heating rate and thermal inertia of particular electronic components have been evaluated by processing pixel-based temperature histories. The data treatment has been performed by using the original ThermoFit Pro software to illustrate that some advanced processing algorithms, such as the Fourier transform and principle component analysis, are valuable in identifying thermal dynamics of particular power supply parts. |
| Langue: | anglais |
| Publié: |
2017
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| Sujets: | |
| Accès en ligne: | http://dx.doi.org/10.1051/matecconf/20179201017 http://earchive.tpu.ru/handle/11683/36724 |
| Format: | Électronique Chapitre de livre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652957 |
| Résumé: | Title screen Potentials of infrared thermography in analyzing a thermal regime of the 7.5 MeV betatron power supply are discussed. Both the heating rate and thermal inertia of particular electronic components have been evaluated by processing pixel-based temperature histories. The data treatment has been performed by using the original ThermoFit Pro software to illustrate that some advanced processing algorithms, such as the Fourier transform and principle component analysis, are valuable in identifying thermal dynamics of particular power supply parts. |
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| DOI: | 10.1051/matecconf/20179201017 |