Hard X-rays with controlled parameters; Charged and Neutral Particles Channeling Phenomena

Hard X-rays with controlled parameters; Charged and Neutral Particles Channeling Phenomena

Détails bibliographiques
Parent link:Charged and Neutral Particles Channeling Phenomena.— 2016.— [P. 203]
Auteur principal: Kocharian (Kocharyan) V. R. Vagan Rashidovich
Collectivité auteur: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Международная научно-образовательная лаборатория неразрушающего контроля (МНОЛ НК)
Résumé:Title screen
In order to gain control over hard X-ray (over 30 keV), X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient has been considered. It has been experimentally proved that the intensity of the reflected beam can be increased up to several orders if the X-ray energies are 30 keV and 40 keV for reflecting atomic planes (10-11) depending on the value of the temperature gradient. It has been shown that with an increase in the temperature gradient the focus becomes closer to the crystal, the focal spot narrows in the diffraction plane and the integral intensity increases tenfold.
Langue:anglais
Publié: 2016
Sujets:
электронный ресурс
труды учёных ТПУ
рентгеновские излучения
Accès en ligne:https://agenda.infn.it/contributionDisplay.py?contribId=155&sessionId=33&confId=10663
Format: Électronique Chapitre de livre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652497

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