Hard X-rays with controlled parameters; Charged and Neutral Particles Channeling Phenomena

Hard X-rays with controlled parameters; Charged and Neutral Particles Channeling Phenomena

Bibliographic Details
Parent link:Charged and Neutral Particles Channeling Phenomena.— 2016.— [P. 203]
Main Author: Kocharian (Kocharyan) V. R. Vagan Rashidovich
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Международная научно-образовательная лаборатория неразрушающего контроля (МНОЛ НК)
Summary:Title screen
In order to gain control over hard X-ray (over 30 keV), X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient has been considered. It has been experimentally proved that the intensity of the reflected beam can be increased up to several orders if the X-ray energies are 30 keV and 40 keV for reflecting atomic planes (10-11) depending on the value of the temperature gradient. It has been shown that with an increase in the temperature gradient the focus becomes closer to the crystal, the focal spot narrows in the diffraction plane and the integral intensity increases tenfold.
Language:English
Published: 2016
Subjects:
электронный ресурс
труды учёных ТПУ
рентгеновские излучения
Online Access:https://agenda.infn.it/contributionDisplay.py?contribId=155&sessionId=33&confId=10663
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652497

Similar Items

Similar Items