Hard X-rays with controlled parameters

Hard X-rays with controlled parameters

Detalles Bibliográficos
Parent link:Charged and Neutral Particles Channeling Phenomena: Book of Abstracts of the 7th International Conference, Sirmione, September 25-30, 2016. [P. 203].— , 2016
Autor Principal: Kocharian (Kocharyan) V. R. Vagan Rashidovich
Autor Corporativo: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Международная научно-образовательная лаборатория неразрушающего контроля (МНОЛ НК)
Summary:Title screen
In order to gain control over hard X-ray (over 30 keV), X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient has been considered. It has been experimentally proved that the intensity of the reflected beam can be increased up to several orders if the X-ray energies are 30 keV and 40 keV for reflecting atomic planes (10-11) depending on the value of the temperature gradient. It has been shown that with an increase in the temperature gradient the focus becomes closer to the crystal, the focal spot narrows in the diffraction plane and the integral intensity increases tenfold.
Publicado: 2016
Subjects:
электронный ресурс
труды учёных ТПУ
рентгеновские излучения
Acceso en liña:https://agenda.infn.it/contributionDisplay.py?contribId=155&sessionId=33&confId=10663
Formato: Electrónico Capítulo de libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=652497

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