Local structure of titanium nitride-based coatings; Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques; Vol. 10, iss. 2
| Parent link: | Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques Vol. 10, iss. 2.— 2016.— [P. 425-428] |
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| Ente Autore: | |
| Altri autori: | , , , , , |
| Riassunto: | Title screen The fine structure of X-ray absorption spectra near the K edge and the extended fine structure of X-ray absorption for titanium, copper, and chromium in nanocrystalline coatings based on titanium nitride doped with copper, chromium, and silicon are experimentally studied. The samples are prepared by the evaporation of composite cathodes using the vacuum arc plasma-assisted method. The parameters of the local environment of titanium, copper, and chromium atoms in the structures of the samples under study are calculated. It is established that the presence of a copper impurity in the coating of no more than 12% in amount leads to a slight increase in the Ti–N distance in comparison with the titanium sample, whereas doping with silicon leads, on the contrary, to a decrease in the bond length. The measurement results for the K absorption edges of copper and chromium confirm that the doping elements are concentrated at the edges of the growing titanium-nitride crystallite and determine its size, which corresponds to the sizes of the coherent-scattering region of 40–50 nm. Режим доступа: по договору с организацией-держателем ресурса |
| Lingua: | inglese |
| Pubblicazione: |
2016
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| Soggetti: | |
| Accesso online: | http://dx.doi.org/10.1134/S1027451016020373 |
| Natura: | MixedMaterials Elettronico Capitolo di libro |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=651505 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 651505 | ||
| 005 | 20250321144604.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\16754 | ||
| 090 | |a 651505 | ||
| 100 | |a 20161115d2016 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 135 | |a drcn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Local structure of titanium nitride-based coatings |f N. A. Timchenko [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 428 (5 tit.)] | ||
| 330 | |a The fine structure of X-ray absorption spectra near the K edge and the extended fine structure of X-ray absorption for titanium, copper, and chromium in nanocrystalline coatings based on titanium nitride doped with copper, chromium, and silicon are experimentally studied. The samples are prepared by the evaporation of composite cathodes using the vacuum arc plasma-assisted method. The parameters of the local environment of titanium, copper, and chromium atoms in the structures of the samples under study are calculated. It is established that the presence of a copper impurity in the coating of no more than 12% in amount leads to a slight increase in the Ti–N distance in comparison with the titanium sample, whereas doping with silicon leads, on the contrary, to a decrease in the bond length. The measurement results for the K absorption edges of copper and chromium confirm that the doping elements are concentrated at the edges of the growing titanium-nitride crystallite and determine its size, which corresponds to the sizes of the coherent-scattering region of 40–50 nm. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques | ||
| 463 | |t Vol. 10, iss. 2 |v [P. 425-428] |d 2016 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a нитрид титана | |
| 610 | 1 | |a локальная структура | |
| 610 | 1 | |a спектроскопия | |
| 701 | 1 | |a Timchenko |b N. A. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences |f 1949- |g Nikolay Alekseevich |3 (RuTPU)RU\TPU\pers\32004 |9 16064 | |
| 701 | 1 | |a Zubavichus |b Y. V. |g Yan Vitautasovich | |
| 701 | 1 | |a Krysina |b O. V. |g Olga Vasiljevna | |
| 701 | 1 | |a Kuznetsov |b S. I. |c physicist |c associate professor of Tomsk polytechnic university, candidate of technical sciences (PhD) |f 1952- |g Sergey Ivanovich |3 (RuTPU)RU\TPU\pers\30071 |9 14491 | |
| 701 | 1 | |a Syrtanov |b M. S. |c physicist |c Associate Professor, Researcher of Tomsk Polytechnic University, Candidate of Technical Sciences |f 1990- |g Maksim Sergeevich |3 (RuTPU)RU\TPU\pers\34764 |9 18114 | |
| 701 | 1 | |a Bondarenko |b S. V. |g Stanislav Vyacheslavovich | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет |b Физико-технический институт |b Кафедра общей физики |3 (RuTPU)RU\TPU\col\18734 |9 27183 |
| 801 | 2 | |a RU |b 63413507 |c 20161115 |g RCR | |
| 856 | 4 | |u http://dx.doi.org/10.1134/S1027451016020373 | |
| 942 | |c CF | ||