Aluminum surface layer strengthening using intense pulsedbeam radiation of substrate film system; IOP Conference Series: Materials Science and Engineering; Vol. 156 : Materials and Technologies of New Generations in Modern Materials Science

Aluminum surface layer strengthening using intense pulsedbeam radiation of substrate film system; IOP Conference Series: Materials Science and Engineering; Vol. 156 : Materials and Technologies of New Generations in Modern Materials Science

Dettagli Bibliografici
Parent link:	IOP Conference Series: Materials Science and Engineering Vol. 156 : Materials and Technologies of New Generations in Modern Materials Science.— 2016.— [012019, 4 p.]
Enti autori:	Томский политехнический университет, Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Проблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП)
Altri autori:	Klopotov А. А., Ivanov Yu. F. Yuriy Fedorovich, Vlasov V. A. Viktor Alekseevich, Kondratyuk А. А. Alexey Alekseevich, Teresov А. D., Shugurov V. V. Vladimir Viktorovich, Petrikova Е. А.
Riassunto:	Title screen The paper presents formation of the substrate film system (Zr-Ti-Cu/Al) by electric arc spraying of cathode having the appropriate composition. It is shown that the intense beam radiation of the substrate film system is accompanied by formation of the multi-phase state, the microhardness of which exceeds the one of pure A7 aluminum by = 4.5 times.
Lingua:	inglese
Pubblicazione:	2016
Soggetti:	электронный ресурс труды учёных ТПУ алюминиевые слои поверхностные слои подложки пленки электрические дуги микротвердость
Accesso online:	http://dx.doi.org/10.1088/1757-899X/156/1/012019 http://earchive.tpu.ru/handle/11683/36555
Natura:	Elettronico Capitolo di libro
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=651427

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