On using ABC for deriving distinguishing sequences for Verilog-descriptions
| Parent link: | East-West Design and Test Symposium (EWDTS), 2015 IEEE: proceedings, Batumi, Georgia, September 26 – 29, 2015. [4 р.].— , 2016 |
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| Autor corporatiu: | |
| Altres autors: | , , , |
| Sumari: | Title screen In this paper, we discuss how a software ABC can be effectively used to derive distinguishing sequences for Verilog-descriptions. A set of these sequences can serve as a test suite for a digital device that is designed based on the corresponding Verilog-description using the FPGA technology. The paper contains a methodology for such test derivation technique, as well as technical details about the use of the tool and necessary commands. ABC can be easily downloaded from its official web site, and an interested reader can always repeat these experiments or apply this technology for more serious industrial need. Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | anglès |
| Publicat: |
2016
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| Matèries: | |
| Accés en línia: | http://dx.doi.org/10.1109/EWDTS.2015.7493150 |
| Format: | Electrònic Llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=651219 |
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| 200 | 1 | |a On using ABC for deriving distinguishing sequences for Verilog-descriptions |f N. G. Kushik [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 330 | |a In this paper, we discuss how a software ABC can be effectively used to derive distinguishing sequences for Verilog-descriptions. A set of these sequences can serve as a test suite for a digital device that is designed based on the corresponding Verilog-description using the FPGA technology. The paper contains a methodology for such test derivation technique, as well as technical details about the use of the tool and necessary commands. ABC can be easily downloaded from its official web site, and an interested reader can always repeat these experiments or apply this technology for more serious industrial need. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 463 | |t East-West Design and Test Symposium (EWDTS), 2015 IEEE |o proceedings, Batumi, Georgia, September 26 – 29, 2015 |v [4 р.] |d 2016 | ||
| 610 | 1 | |a электронный ресурс | |
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| 701 | 1 | |a Kushik |b N. G. |g Nataljya Gennadjevna | |
| 701 | 1 | |a Evtushenko |b N. V. |g Nina Vladimirovna | |
| 701 | 1 | |a Torgaev |b S. N. |c specialist in the field of electronics |c associate Professor of Tomsk Polytechnic University, candidate of physico-mathematical Sciences |f 1984- |g Stanislav Nikolaevich |3 (RuTPU)RU\TPU\pers\31663 |9 15800 | |
| 701 | 1 | |a Shatilov |b N. P. |g Nikita Petrovich | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Институт неразрушающего контроля (ИНК) |b Кафедра промышленной и медицинской электроники (ПМЭ) |3 (RuTPU)RU\TPU\col\18719 |
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