Thermal damage at short electron bunches passage through a thin target; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015)

Bibliographic Details
Parent link:Journal of Physics: Conference Series
Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015).— 2016.— [012030, 7 p.]
Main Author: Babaev A. A. Anton Anatoljevich
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ) Международная научно-образовательная лаборатория "Рентгеновская оптика" (МНОЛ РО)
Other Authors: Gogolev A. S. Aleksey Sergeevich
Summary:Title screen
The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature.
Language:English
Published: 2016
Series:Monochromatic X- and Gamma Beams Produced at Electron Accelerators
Subjects:
Online Access:http://dx.doi.org/10.1088/1742-6596/732/1/012030
http://earchive.tpu.ru/handle/11683/33961
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650753

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